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1. • Journal article

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   Rheology of amorphous olivine thin films characterized by nanoindentation

   Baral, Paul[UCL] Orekhov, Andrey[UCL] Dohmen, Ralf Coulombier, Michaël[UCL] Raskin, Jean-Pierre[UCL] Cordier, Patrick Idrissi, Hosni[UCL] Pardoen, Thomas[UCL] (2021) Acta Materialia — Vol. 219, p. 117257 (2021)
2. • Journal article

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   Modeling of Semiconductor Substrates for RF Applications: Part I—Static and Dynamic Physics of Carriers and Traps

   Rack, Martin[UCL] Frédéric Allibert Raskin, Jean-Pierre[UCL] (2021) IEEE Transactions on Electron Devices — Vol. 68, no.9, p. 4598-4605 (2021)
3. • Journal article

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   Modeling of Semiconductor Substrates for RF Applications: Part II—Parameter Impact on Harmonic Distortion

   Rack, Martin[UCL] Frédéric Allibert Raskin, Jean-Pierre[UCL] (2021) IEEE Transactions on Electron Devices — Vol. 68, no.9, p. 4606-4613 (2021)
4. • Journal article

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   Porous silicon membranes and their applications: Recent advances

   Vercauteren, Roselien[UCL] Scheen, Gilles[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] (2021) Sensors and Actuators A: Physical — Vol. 318, no. 112486, p. 20 (2021)
5. • Journal article

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   On‑chip environmentally assisted cracking in thin freestanding SiO2 films

   Jaddi, Sahar[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2021) Journal of Materials Research — Vol. 36, no. 12, p. 2479-2494 (2021)
6. • Journal article

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   Could Unsustainable Electronics Support Sustainability

   Moreau, Nicolas[UCL] Pirson, Thibault[UCL] Le Brun, Grégoire[UCL] Delhaye, Thibault[UCL] Sandu, Georgiana[UCL] Paris, Antoine[UCL] Bol, David[UCL] Raskin, Jean-Pierre[UCL] (2021) Sustainability — Vol. 13, no. 6541, p. 7 (2021)
7. • Journal article

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   Accurate SOI MOSFET characterisation at microwave frequencies for device performance optimisation and analogue modeling

   Raskin, Jean-Pierre[UCL] Gillon, R. Chen, J. Vanhoenacker-Janvier, Danielle[UCL] Collinge, J.-P. (1998) IEEE Transactions on Electron Devices — Vol. 45, no.5, p. 1017-1025 (1998)
8. • Journal article

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   Electrochemical Characterization of Nitrocellulose Membranes towards Bacterial Detection in Water

   Le Brun, Grégoire[UCL] Hauwaert, Margo[UCL] Leprince, Audrey[UCL] Glinel, Karine[UCL] Mahillon, Jacques[UCL] Raskin, Jean-Pierre[UCL] (2020) Proceedings — Vol. 60, no. 1, p. 61 (2020)
9. • Journal article

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   A dynamic study for wafer-level bonding strength uniformity in low-temperature wafer bonding

   Zhang, XX Raskin, Jean-Pierre[UCL] (2005) Electrochemical and Solid-State Letters — Vol. 8, no. 10, p. G268-G270 (2005)
10. • Journal article

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    Frequency Variation of the Small-Signal Output Conductance of Decananometer MOSFETs Due to Substrate Crosstalk

    Kilchytska, Valeriya[UCL] Pailloncy, Guillaume[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] Collaert, N. Jurczak, M. Flandre, Denis[UCL] (2007) IEEE ELECTRON DEVICE LETTERS — Vol. 28, no. 5, p. 419-421 (May 2007)
11. • Journal article

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    Impact of High Temperature Up to 175 ∘ C on the DC and RF Performances of 22-nm FD-SOI MOSFETs

    Halder, Arka[UCL] Nyssens, Lucas[UCL] Vanbrabant, Martin[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Transactions on Electron Devices — , p. 1-6 (2023)
12. • Journal article

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    Comparison of Heat Sinks in Back-End of Line to reduce Self-Heating in 22FDX® MOSFETs

    Halder, Arka[UCL] Nyssens, Lucas[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 207, p. 108706 (2023)
13. • Journal article

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    Accurate determination of stiffness and strength of graphene via AFM-based membrane deflection

    Bahrami, Farzaneh[UCL] Malik, Mohammad Wasil[UCL] Van Loock, Frederik[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Nysten, Bernard[UCL] (2023) Measurement Science and Technology — Vol. 34, no.12, p. 125027 (2023)
14. • Journal article

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    Raman Strain-Shift Measurements and Prediction from First-Principles in Highly-Strained Silicon

    Roisin, Nicolas[UCL] Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2023) Journal of Materials Science: Materials in Electronics — Vol. 34, p. 373 (2023)
15. • Journal article

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    High-Temperature Characterization of Multiple Silicon-Based Substrate for RF-IC Applications

    Courte, Quentin[UCL] Rack, Martin[UCL] Nabet, Massinissa[UCL] Cardinael, Pieter[UCL] Raskin, Jean-Pierre[UCL] (2022) IEEE Journal of the Electron Devices Society — Vol. 10, no.1, p. 620-626 (2022)
16. • Journal article

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    Enhanced Gas Detection by Altering Gate Voltage Polarity of Polypyrrole/Graphene Field-Effect Transistor Sensor

    Tang, Xiaohui[UCL] Raskin, Jean-Pierre[UCL] Reckinger, Nicolas Yan, Yiyi[UCL] André,Nicolas Lahem, Driss Debliquy, Marc (2022) Chemosensors — Vol. 10, no.11, p. 467 (2022)
17. • Journal article

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    Fully Depleted SOI Technology for Millimeter-Wave Integrated Circuits

    Raskin, Jean-Pierre[UCL] (2022) IEEE Journal of the Electron Devices Society — Vol. 10, p. 424-434 (2022)
18. • Journal article

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    Back-Gate Lumped Resistance Effect on AC Characteristics of FD-SOI MOSFET

    Vanbrabant, Martin[UCL] Nyssens, Lucas[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) IEEE Microwave and Wireless Components Letters — Vol. 32, no.6, p. 704-707 (2022)
19. • Journal article

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    Towards circular ICT: from materials to components

    Ernst, Thomas Raskin, Jean-Pierre[UCL] (2021) HiPEAC Vision 2021 — , p. 122-129 (2021)
20. • Journal article

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    The Environmental Footprint of IC Production: Review, Analysis and Lessons from Historical Trends

    Pirson, Thibault[UCL] Delhaye, Thibault P.[UCL] Pip, Alex[UCL] Brun, Gregoire Le[UCL] Raskin, Jean-Pierre[UCL] Bol, David[UCL] (2023) IEEE Transactions on Semiconductor Manufacturing — Vol. 36, p. 56-67 (2023)
21. • Journal article

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    High-resistivity silicon-based substrate using buried PN junctions towards RFSOI applications

    Moulin, M. Rack, Martin[UCL] Fache, T. Chalupa, Z. Plantier, C. Morand, Y. Lacord, J. Allibert, F. Gaillard, F. Lugo, J. Hutin, L. Raskin, Jean-Pierre[UCL] (2022) Solid-State Electronics — Vol. 194, p. 108301 (2022)
22. • Journal article

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    Time Dependence of RF Losses in GaN-on-Si Substrates

    Cardinael, Pieter[UCL] Yadav, Sachin Zhao, Ming Rack, Martin[UCL] Lederer, Dimitri[UCL] Collaert, Nadine Parvais, Bertrand Raskin, Jean-Pierre[UCL] (2022) IEEE Microwave and Wireless Components Letters — Vol. 32, no.6, p. 688-691 (2022)
23. • Journal article

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    Back-gate bias effect on the linearity of pocket doped FDSOI MOSFET

    Shaik, Rameez Raja Chandrasekar, L. Raskin, Jean-Pierre[UCL] Pradhan, K.P. (2022) Microelectronics Journal — Vol. 121, p. 105365 (2022)
24. • Journal article

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    High-resistivity with PN interface passivation in 22 nm FD-SOI technology for low-loss passives at RF and millimeter-wave frequencies

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Nabet, Massinissa[UCL] Schwan, C. Zhao, Z. Lhemann, S. Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 205 (2023)
25. • Journal article

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    Development Of High Resistivity FD-SOI Substrates for mmWave Applications

    Bertrand, Isabelle Flatresse, Philippe Besnard, Guillaume Bethoux, Jean-Marc Chalupa, Zdenek Plantier, Christophe Rack, Martin[UCL] Nabet, Massinissa[UCL] Raskin, Jean-Pierre[UCL] Allibert, Frederic (2022) ECS Transactions — Vol. 108, no.5, p. 31-45 (2022)

Pages