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Displaying 1 - 25 of 37 results.

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    • Journal article
    25 to 300 degrees C ultra-low-power voltage reference compatible with standard SOICMOS process
    Adriaensen, Stéphane[UCL] Flandre, Denis[UCL] Dessard, Vincent[UCL] (2002) Electronics Letters — Vol. 38, no. 19, p. 1103-1104 (2002)
    • Speech
    A 110 nA pacemaker sensing channel in CMOS on silicon-on-insulator
    Silveira, Fernando Flandre, Denis[UCL] (2002) IEEE International Symposium on Circuits and Systems (ISCAS'2002) — Scottsdale, Arizona (USA)
    • Speech
    Design of a branch-based carry-select adder IP portable in 0.25 mu m bulk and silicon-on-insulator CMOS technologies
    Neve, Amaury[UCL] Flandre, Denis[UCL] (2002) SOC Design Methodologies. IFIP TC10/WG10.5 Eleventh International Conference on Very Large Scale Integration of Systems-on-Chip (VLSI-SOC'01) — Montpellier (France)
    • BookChapter
    Design of a Branch-Based Carry-Select Adder IP Portable in 0.25 µm Bulk and Silicon-On-Insulator CMOS Technologies
    Nève de Mévergnies, Amaury[UCL] Flandre, Denis[UCL] (2002) Soc Design Methodologies - IFIP TC10/WG 10.5 - Eleventh International Conference on Very Large Scale Integration of Systems-on-Chip (VLSI-SOC'01) December 3-5, 2001, Montpellier, France — [ISBN : 1-4020-7148-5]
    • Speech
    Design of a branch-based 64-bit carry-select adder in 0.18 mu m partially depleted SOI CMOS
    Neve, A. Flandre, Denis[UCL] Schettler, H. Ludwig, T. Hellner, G. (2002) ISLPED'02: Proceedings of the 2002 International Symposium on Low Power Electronics and Design — Monterey, CA (USA)
    • Speech
    Design of a Branch-Based 64-bit Carry-Select Adder in 0.18 µm Partially-Depleted SOI CMOS
    Nève, Amaury[UCL] Schettler, H.[UCL] Ludwig, T.[UCL] Hellner, G.[UCL] Flandre, Denis[UCL] (2002) 2002 International Symposium on Low Power Electronics and Design (ISLPED '02) — Monterey (USA)
    • Speech
    A physically-based continuous model for graded-channel SOI MOSFET
    Pavanello, Marcelo Antonio Iniguez, Benjamin Flandre, Denis[UCL] Martino, Joao Antonio (2002) XVII SBMicro Microelectronics Technology and Devices (ECS 2002) — Brazilia (Brazil)
    • Journal article
    Low temperature operation of graded-channel SOI nMOSFETs for analog applications
    Pavanello, MA Der Agopian, PG Martino, JA Flandre, Denis[UCL] (2002) Journal de Physique IV — Vol. 12, no. 3, p. 23-26 (2002)
    • Journal article
    SOI n-MOSFET low-frequency noise measurements and modeling from room temperature up to 250 degrees C
    Dessard, Vincent[UCL] Flandre, Denis[UCL] Iniguez, Benjamin Adriaensen, Stéphane[UCL] (2002) IEEE Transactions on Electron Devices — Vol. 49, no. 7, p. 1289-1295 (2002)
    • Speech
    Analog performance of graded-channel SOI nMOSFETs at low temperatures
    Pavanello, Marcelo Antonio Martino, Joao Antonio Flandre, Denis[UCL] (2002) XVII SBMicro Microelectronics Technology and Devices (ECS 2002) — Brazilia (Brazil)
    • Journal article
    New method for determination of harmonic distortion in SOI FD transistors
    Cerdeira, A. Flandre, Denis[UCL] Estrada, M. Quintero, R Ortiz-Conde, A Sanchez, FJG (2002) Solid-State Electronics — Vol. 46, no. 1, p. 103-108 (2002)
    • Speech
    Electrical characterization of an industrial SOS-CMOS process up to 300°C
    Vancaillie, Laurent[UCL] Kilchytska, Valeriya[UCL] Levacq, David[UCL] Dessard, Vincent[UCL] Demeûs, Laurent[UCL] Flandre, Denis[UCL] (2002) 6th High Temperature Electronics Conference (HITEC) — Albuquerque (USA)
    • Journal article
    On the high-temperature subthreshold slope of thin-film SOI MOSFETs
    Rudenko, Tamara Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Colinge, Jean-Pierre[UCL] Dessard, Vincent[UCL] (2002) IEEE Electron Device Letters — Vol. 23, no. 3, p. 148-150 (March 2002)
    • Speech
    Low temperature operation of graded-channel SOI nMOSFETs for analog applications
    Pavanello, Marcelo Antonio Der Agopian, P.G. Martino, Joao Antonio Flandre, Denis[UCL] (2002) 5th European Workshop on Low Temperature Electronics (WOLTE 2002) — Grenoble (France)
    • Journal article
    A method to extract mobility degradation and total series resistance of fully-depleted SOI MOSFETs
    Sanchez, FJG Flandre, Denis[UCL] Ortiz-Conde, A Cerdeira, A. Estrada, M. Liou, JJ (2002) IEEE Transactions on Electron Devices — Vol. 49, no. 1, p. 82-88 (Janvier 2002)

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