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1. • Speech

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   Bottom-Up Life-Cycle Assessment of MEMS Piezoresistive Pressure Sensors

   Delhaye, Thibault[UCL] Le Brun, Grégoire[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2021) Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS — Virtual event
2. • Journal article

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   Frequency Variation of the Small-Signal Output Conductance of Decananometer MOSFETs Due to Substrate Crosstalk

   Kilchytska, Valeriya[UCL] Pailloncy, Guillaume[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] Collaert, N. Jurczak, M. Flandre, Denis[UCL] (2007) IEEE ELECTRON DEVICE LETTERS — Vol. 28, no. 5, p. 419-421 (May 2007)
3. • Journal article

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   Raman Strain-Shift Measurements and Prediction from First-Principles in Highly-Strained Silicon

   Roisin, Nicolas[UCL] Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2023) Journal of Materials Science: Materials in Electronics — Vol. 34, p. 373 (2023)
4. • Speech

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   Control of sputtered VO2 thin film grain size through O2 concentration

   Bidoul, Noémie[UCL] Huet, Benjamin Ureña-Begara, Ferran Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Micro and Nano Engineering conference (MNE) EUROSENSORS 2022 — Leuven, Belgium
5. • Speech

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   Tuning the stochasticity of VO2 neurons firing-threshold through grain size engineering

   Bidoul, Noémie[UCL] Huet, Benjamin[UCL] Ureña Begara, Ferran[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2023) NeuMatDeCaS 2023 — Valencia, Spain
6. • Speech

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   Experimental study of thermal coupling effects in FD-SOI MOSFET

   Vanbrabant, Martin[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2022) The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022 — Udine, Italy
7. • Speech

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   Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks

   Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Faniel, Sébastien[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2022) The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022 — Udine, Italy
8. • Speech

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   Bottom-Up Life-Cycle Assessment of MEMS Piezoresistive Pressure Sensors

   Delhaye, Thibault P. Le Brun, Grégoire[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) — Paris, France
9. • Speech

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   Improving the determination of strain in the deformed Silicon measured by Raman spectroscopy

   Francis, Laurent[UCL] Roisin, Nicolas[UCL] Colla, Marie-Stéphane[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2023) International Meeting on Optical Measurement Techniques and Industrial Applications — Delft (Netherlands)
10. • Journal article

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    Low-Power Silicon Strain Sensor Based on CMOS Current Reference Topology

    Roisin, Nicolas[UCL] Delhaye, Thibault[UCL] André, Nicolas[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Low-Power Silicon Strain Sensor Based on CMOS Current Reference Topology — Vol. 339, no.113491, p. 1-11 (2022)
11. • Journal article

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    Characterization of thin Al2O3/SiO2 dielectric stack for CMOS transistors

    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Bin, Wang Faniel, Sébastien[UCL] Zeng, Yun Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Microelectronic Engineering — Vol. 254, no.111708, p. 7 (2022)
12. • Journal article

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    Variation Range of Different Inductor Topologies with Shields for RF and Inductive Sensing Applications

    Tounsi, Fares[UCL] Hadj Said, Mohamed Hauwaert, Margo[UCL] Kaziz, Sinda Francis, Laurent[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Sensors — Vol. 22, no.9, p. 15 (2022)
13. • Journal article

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    Experimental study of thermal coupling effects in FD-SOI MOSFET

    Vanbrabant, Martin[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2022) Solid-State Electronics — Vol. 194, no.108362, p. 4 (2022)
14. • Journal article

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    Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications

    Kilchytska, Valeriya[UCL] Makovejev, Sergej Esfeh, Babak Kazemi Nyssens, Lucas[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2021) I E E E Journal of the Electron Devices Society — Vol. 9, p. 500-510 (2021)
15. • Journal article

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    Indirect light absorption model for highly strained silicon infrared sensors

    Roisin, Nicolas[UCL] Brunin, Guillaume[UCL] Rignanese, Gian-Marco[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2021) Journal of Applied Physics — Vol. 30, no.5, p. 30 (2021)
16. • Speech

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    Determination of Carrier Lifetime in Silicon Using an Ultra-thin Al2O3/SiO2 Dielectric Stack

    Yan, Yiyi[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Faniel, Sébastien[UCL] Tang, Xiaohui[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 IEEE Latin America Electron Devices Conference (LAEDC) — Virtual conference
17. • Journal article

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    Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method

    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2022) Solid-State Electronics — Vol. 194, p. 4 (2022)
18. • Journal article

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    Improved Split CV Mobility Extraction in 28 nm Fully Depleted Silicon on Insulator Transistors

    Morelle, Alban Vandermolen, Eric Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2021) IEEE Electron Device Letters — Vol. 42, no.5, p. 661-664 (2021)
19. • Journal article

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    Analysis of trap distribution and NBTI degradation in Al2O3/SiO2 dielectric stack

    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid State Electronics — Vol. 207, no.207 (2023)
20. • Patent

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    Fabrication method of semiconductor devices

    Nève, Amaury[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2002)
21. • BookChapter

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    Some mitigations for unequal data variance in linear regression

    Dupuis, Pascal[UCL] Van Overstraeten, Nancy[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] (2012) Advanced Mathematical and Computational Tools in Metrology and Testing IX — [ISBN : 978-981-4397-94-0]
22. • Speech

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    Near-IR response of highly-strained Si photodetector linking first principles and TCAD

    Roisin, Nicolas[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2023) ESSDERC-ESSCIRC 2023 — Lisbon
23. • Speech

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    Band gap narrowing in highly-strained silicon beams observed using photoluminescence spectroscopy

    Roisin, Nicolas[UCL] Colla, Marie-Stéphane[UCL] Scaffidi, Romain[UCL] Pardoen, Thomas[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2023) BePOM 2023 — Bruxelles
24. • Speech

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    Hexagonal Boron Nitride Memristor based on a nanogap self-formed by silicidation

    Yan, Yiyi[UCL] Reckinger, Nicolas Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Tang, Xiaohui[UCL] Malik, Mohammad Wasil[UCL] Hackens, Benoît[UCL] Raskin, Jean-Pierre[UCL] (2022) Mini Colloquia (MQ) on "Memristive Devices", The 6th Symposium on Schottky Barrier MOS Devices (SSBMOS) — Giessen, Germany
25. • Speech

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    Optical performances prediction of highly strained silicon photodetector

    Roisin, Nicolas[UCL] Brunin, Guillaume[UCL] Rignanese, Gian-Marco[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2022) 7th edition of the silicon photonics Summer School — C2N Paris-Saclay, France

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