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1. • Journal article

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   Rapid and selective detection of Staphylococcus aureus using insulated substrate impedance transducers

   Tang, Xiaohui[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Nizet, Yannick[UCL] Moreno-Hagelsieb, L. Pampin, R. Francis, Laurent[UCL] (2011) Sensors and Actuators — Vol. B, no.156, p. 578-587 (2011)
2. • Journal article

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   Neutron and gamma radiation effects on MEMS structures

   Gkotsis, Petros[UCL] Kilchytska, Valeriya[UCL] Bhaskar, Umesh Kumar[UCL] Militaru, Otilia[UCL] Tang, Xiaohui[UCL] Fragkiadakis, C. Kirby, P.B. Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Francis, Laurent[UCL] (2011) Procedia Engineering — Vol. 25, pp. 172-175 (2011)
3. • Journal article

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   The impact of etched trenches geometry and dielectric material on the electrical behaviour of SOI self-switching diodes

   Farhi, G. Morris, D. Charlebois, S.A. Raskin, Jean-Pierre[UCL] (2011) Nanotechnology — Vol. 22, no.43, p. 435203 (2011)
4. • Journal article

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   Mobility degradation and transistor asymmetry impact on field effect transistor access resistances extraction

   Tinoco, J.C. Martinez-Lopez, A.G. Raskin, Jean-Pierre[UCL] (2011) Solid-State Electronics — Vol. 56, no. 1, p. 214-218 (February 2011)
5. • Journal article

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   RF extraction of self-heating effects in FinFETs of various geometries

   Makovejev, Sergej[UCL] Olsen, S.H. Raskin, Jean-Pierre[UCL] (2011) IEEE Transactions on Electron Devices — Vol. 58, no.10, pp. 3335-3341 (October 2011)
6. • Journal article

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   Characterizing the effect of uniaxial strain on the surface roughness of Si nanowire MEMS-based microstructures

   Escobedo-Cousin, E. Olsen, S.H. Pardoen, Thomas[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] (2011) MRS Proceedings, Micromechanical Systems - Materials and Devices — Vol. 1299, p. article 25 (2011)
7. • Journal article

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   High Temperature effect on Harmonic Distortions in submicron Graded-Channel MOSFETs

   Emam, Mostafa[UCL] Pavanello, M.A. Danneville, François Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2011) Advanced Materials Research — Vol. 276, no. -, pp. 67-75 (July 2011)
8. • Journal article

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   Functionalization of Silicon Nanowires for Specific Sensing

   Passi, Vikram[UCL] Dubois, E. Celle, C. Clavaguera, S. Simonato, J.-P. Raskin, Jean-Pierre[UCL] (2011) Electrochemical Society. Transactions — Vol. 35, no. 5, pp. 313-318 (May 10, 2011)
9. • Journal article

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   Nonlinear properties of Si-based substrates for wireless systems and SoC integration

   Roda Neve, Cesar[UCL] Raskin, Jean-Pierre[UCL] (2011) Electrochemical Society. Transactions — Vol. 35, no. 5, pp. 169-176 (May 2011)
10. • Journal article

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    Routes towards novel active pressure sensors in SOI technology

    Olbrechts, Benoit[UCL] Rue, Bertrand[UCL] Pardoen, Thomas[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2011) Advanced Materials Research — Vol. 276, no. -, pp. 145-155 (July 2011)
11. • Journal article

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    Ultra Low Power 3-D Flow Meter in Monolithic SOI Technology

    André, Nicolas[UCL] Rue, Bertrand[UCL] Scheen, Gilles[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2011) Electrochemical Society. Transactions — Vol. 35, no. 5, p. 319-324 (May 6, 2011)
12. • Journal article

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    Nanomechanical testing of free-standing monocrystalline silicon beams

    Bhaskar, Umesh Kumar[UCL] Houri, Samer[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) ECS Transactions — Vol. 35, no. 5, p. 221-226 (May 2011)
13. • Journal article

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    On-chip tensile testing of the mechanical and electro-mechanical properties of nano-scale silicon free-standing beams

    Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Zulfiqar, Azeem[UCL] Sodervall, U. Nilsson, B. Peterson, G. Hagberg, M. Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) Advanced Materials Research — Vol. 276, no. -, pp. 117-126 (2011)
14. • Journal article

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    High gain and fast detection of warfare agent using back-gated silicon nanowires MOSFETs

    Passi, Vikram[UCL] Ravaux, Fabian[FUCAM] Dubois, E. Clavaguera, S. Celle, C. Simonato, J.P. Silvestri, L. Reggiani, S. Vuillaume, D. Raskin, Jean-Pierre[UCL] (2011) IEEE Electron Device Letters — Vol. 32, no. 7, p. 976-978 (July 2011)
15. • Journal article

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    Zero Temperature Coefficient of current gain cutoff frequency and maximum oscillation frequency for various SOI and Si bulk MOSFETs

    Emam, Mostafa[UCL] Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2011) Electrochemical Society. Transactions — Vol. 35, no. 5, pp. 129-134 (May 10, 2011)
16. • Journal article

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    Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer

    Roda Neve, Cesar[UCL] Kilchytska, Valeriya[UCL] Alvarado, Jose Joaquin[UCL] Lederer, Dimitri Militaru, Otilia[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2011) Microelectronics Reliability — Vol. 51, no. 2, p. 326-331 (Février 2011)
17. • Journal article

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    A new interdigitated array microelectrode-oxide-silicon sensor with label-free, high sensitivity and specificity for fast bacteria detection

    Tang, Xiaohui[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Nizet, Yannick[UCL] Moreno Hagelsieb, Luis[UCL] Pampin, Rémi[UCL] Francis, Laurent[UCL] (2011) Sensors and Actuators B: Chemical — Vol. 156, no. 2, p. 578-587 (2011)
18. • Journal article

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    A novel Approach for Active Pressure Sensors in Thin Film SOI Technology

    Olbrechts, Benoit[UCL] Rue, Bertrand[UCL] Pardoen, Thomas[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2011) Procedia Engineering — Vol. 25, p. 43-46 (2011)
19. • Journal article

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    Energy-Band Engineering for Improved Charge Retention in Fully Self-Aligned Double Floating-Gate Single-Electron Memories

    Tang, Xiaohui[UCL] Krzeminski, Christophe Lecavalier des Etangs-Levallois, Aurélien Chen, Zhenkun Dubois, Emmanuel Kasper, Erich Karmous, Alim Reckinger, Nicolas[UCL] Flandre, Denis[UCL] Francis, Laurent[UCL] Colinge, Jean-Pierre Raskin, Jean-Pierre[UCL] (2011) Nano Letters : a journal dedicated to nanoscience and nanotechnology — Vol. 11, no. 11, p. 4520-4526 (3 octobre 2011)
20. • Journal article

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    Experimental observations of surface roughness in uniaxially loaded strained Si microelectromechanical systems-based structures

    Escobedo-Cousin, Enrique Olsen, Sarah H. Pardoen, Thomas[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] (2011) Applied Physics Letters — Vol. 99, p. 241906 (2011)
21. • Journal article

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    Note: Fast and reliable fracture strain extraction technique applied to silicon at nanometer scale

    Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Sodervall, Ulf Nilsson, Bengt Petersson, Goran Hagberg, Mats Raskin, Jean-Pierre[UCL] (2011) Review of Scientific Instruments — Vol. 82, p. 116106 (2011)
22. • Journal article

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    On the MOSFET Threshold Voltage Extraction by Transconductance and Transconductance-to-Current Ratio Change Methods: Part I—Effect of Gate-Voltage-Dependent Mobility

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Arshad, M.K.M. Raskin, Jean-Pierre[UCL] Nazarov, A. Flandre, Denis[UCL] (2011) IEEE Transactions on Electron Devices — no. 99, p. 1-8 (14 octobre 2011)
23. • Journal article

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    Erbium Silicide Growth in the Presence of Residual Oxygen

    Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Godey, Sylvie Dubois, Emmanuel Laszcz, Adam Ratajczak, Jacek Vlad, Alexandru[UCL] Dutu, Constantin Augustin[UCL] Raskin, Jean-Pierre[UCL] (2011) Journal of the Electrochemical Society — Vol. 158, no. 7, p. H715-H723 (11/05/2011)
24. • Journal article

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    Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins

    Idrissi, Hosni Wang, Binjie Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Schryvers, Dominique Pardoen, Thomas[UCL] (2011) Advanced Materials — Vol. 23, no. 18, p. 2119-2122
25. • Journal article

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    Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study

    Idrissi, Hosni Tumer, Stuart Mitsuhara, Masatoshi Wang, Binjie Hata, Satoshi Coulombier, Michaël[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Van Tendeloo, Gustaaf Schryvers, Dominique (2011) Microscopy and Microanalysis — Vol. 17, no. 6, p. 983-990

Pages