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1. • Journal article

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   Experimental study of transconductance and mobility behaviors in ultrathin SOI MOSFETs with standard and thin buried oxides

   Rudenko, T. Kilchytska, Valeriya[UCL] Burignat, S. Raskin, Jean-Pierre[UCL] Andrieu, F. Faynot, O. Le Tiec, Y. Landry, K. Nazarov, A. Lysenko, V. S. Flandre, Denis[UCL] (2010) Solid-State Electronics — Vol. 54, p. 164-170 (2010)
2. • Journal article

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   Behaviour of CPW and TFMS lines at high temperature for RF applications in sub-45 nm nodes

   Roda Neve, C. Farci, A. Gallitre, M. Blampey, B. Meuris, P. Arnaud, L. Raskin, Jean-Pierre[UCL] (2010) Microelectronics Journal — Vol. 87, no.3, p. 324-328 (2010)
3. • Journal article

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   Substrate impact on threshold voltage and subthreshold slope of sub-32 nm Ultra Thin SOI MOSFETs with thin Buried Oxide and undoped channel

   Burignat, S. Flandre, Denis[UCL] Md Arshad, M. K. Kilchytska, Valeriya[UCL] Andrieux, F. Faynot, O. Raskin, Jean-Pierre[UCL] (2010) Solid-State Electronics — Vol. 54, p. 213-219 (2010)
4. • Speech

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   TEM characterization of twinned nanocrystalline palladium thin films

   Idrissi, H. Wang, B. Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Schrijvers, D. Pardoen, Thomas[UCL] (2010) 2010 Materials Research Society Fall Meeting - MRS Fall'10 — Boston, MA, USA
5. • Speech

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   Graded Channel concept used to improve RF noise of an industrial 0.15 µm SOI CMOS technology

   Emam, Mostafa[UCL] Sakalas, P.[UCL] Kumar, A.[UCL] Ida, J.[UCL] Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] Danneville, François[UCL] (2010) The 5th European Microwave Integrated Circuits Conference - EuMIC’10 — Paris, France
6. • Speech

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   Mechanical properties characterization of freestanding palladium films by on-chip internal stress controlled nanomechanical tensile testing

   Colla, Marie-Stéphane[UCL] Coulombier, Michaël[UCL] Boé, A. Idrissi, H. Wang, B. Schrijvers, D. Proost, Joris[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2010) Nanobrucken Nanomechanical testing Workshop, INM — Saarbrucken - Germany
7. • Speech

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   Quasi-optical technique for sensing bond quality of silicon wafers

   Elhawil, A. Huynen, Isabelle[UCL] Raskin, Jean-Pierre[UCL] Roda Neve, Cesar[UCL] Olbrechts, Benoit[UCL] Stiens, J. Vounckx, R. (2010) Micro-Optics 2010 — Brussels, Belgium
8. • Speech

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   New RF Intrinsic Parameters Extraction Procedure for Advanced MOS Transistors

   Tinoco, J.C. Martinez-Lopez, A.G. Emam, Mostafa[UCL] Raskin, Jean-Pierre[UCL] (2010) 2010 23rd IEEE ICMTS International Conference on Microelectronic Test Structures (ICMTS 2010) — Hiroshima, Japan
9. • Journal article

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   Small-signal analysis of high-performance of p- and n-type SOI SB-MOSFETs with dopant segregation

   Urban, C. Emam, Mostafa[UCL] Sandow, C. Zhao, Q.T. Fox, A. Mantl, S. Raskin, Jean-Pierre[UCL] (2010) Solid-State Electronics — Vol. 54, no. 9, p. 877-882 (September 2010)
10. • Journal article

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    Impact of crosstalk into high resistivity silicon substrate on the RF performance of SOI MOSFET

    Ben Ali, Khaled[UCL] Roda Neve, Cesar[UCL] Gharsallah, A. Raskin, Jean-Pierre[UCL] (2010) Journal of Telecommunications and Information Technology — Vol. 4, p. 93-100 (2010)
11. • Journal article

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    High temperature effects on harmonic distortions in submicron graded-channel MOSFETs

    Emam, Mostafa[UCL] Pavanello, M.A. Danneville, François Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2010) Advanced Materials Research — p. 5 pages (2010)
12. • Journal article

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    New RF series extrinsic resistances extraction procedure for deep-submicron MOS transistors

    Tinoco, J.C. Raskin, Jean-Pierre[UCL] (2010) International Journal of Numerical Modelling: Electronic Networks, Devices and Fields — Vol. 23, no. 2, p. 107-126 (2010)
13. • Journal article

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    PECVD oxide as intermediate film for wafer bonding : impact of residual stress

    Olbrechts, Benoit[UCL] Raskin, Jean-Pierre[UCL] (2010) Microelectronic Engineering — Vol. 87, no. 11, p. 2178-2186 (November 2010)
14. • Journal article

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    A single layer hydrogen silsesquioxane based lift-off process for germanium and platinum

    Passi, Vikram[UCL] Lecestre, Aurélie Krzeminski, Christophe Larrieu, Guilhem Dubois, Emmanuel Raskin, Jean-Pierre[UCL] (2010) Microelectronic Engineering — Vol. 87, no. 10, p. 1872-1878 (October 2010)
15. • Speech

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    Behaviour of CPW and TFMS lines at high temperature for RF applications in sub-45 nm nodes

    Roda Neve, Cesar[UCL] Farcy, A. Gallitre, M. Blampey, B. Meuris, P.[UCL] Arnaud, L. Raskin, Jean-Pierre[UCL] (2010) 18th European Workshop on Materials for Advanced Metallization — Grenoble(France)
16. • Speech

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    Experimental study of transconductance and mobility behaviors in ultra-thin SOI MOSFETs with standard and thin buried oxides

    Rudenko, T. Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Burignat, S.[UCL] Raskin, Jean-Pierre[UCL] Andrieu, F. Faynot, O. Le Tiec, Y. Landry, K. Nazarov, A. Lysenko, V. S. (2010) 5th Workshop of the Thematic-Network-on-Silicon-on-Insulator-Technology-Devices-and-Circuits (EUROSOI 2009) — Chalmers Univ Technol, Gothenburg (Sweden)
17. • Journal article

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    A fast and robust algorithm to assess respiratory frequency in real-time

    Dupuis, Pascal[UCL] André, Nicolas[UCL] Gérard, Pierre[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] (2010) Procedia Engineering — Vol. 5, p. 576-579 (2010)
18. • Journal article

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    Ultra Low Power flow-to-frequency SOI MEMS transducer

    André, Nicolas[UCL] Rue, Bertrand[UCL] Van Vynckt, D.[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2010) Procedia Engineering — Vol. 5, p. 540-543 (2010)
19. • Journal article

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    Contactless monitoring of Si substrate permittivity and resistivity from microwave to millimeter-wave frequencies

    Elhawil, A. Roda Neve, Cesar[UCL] Olbrechts, Benoit[UCL] Huynen, Isabelle[UCL] Raskin, Jean-Pierre[UCL] Poesen, G. Zhang, Lei[UCL] Stiens, J. Vounckx, R. (2010) Microwave & Optical Technology Letters — Vol. 52, no. 11, pp. 2500-2505 (November 2010)
20. • Speech

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    MuGFETs for microwave and millimeter wave applications

    Tinoco, Julio Raskin, Jean-Pierre[UCL] (2010) International Conference on Solid-State and Integrated Circuit Technology – ICSICT 2010 — Shanghai, China
21. • Speech

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    Fabrication process for applying high mechanical stress on monocrystalline silicon film

    Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2010) 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics” — Kyiv, Ukraine
22. • Speech

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    High Temperature effect on Harmonic Distortions in submicron Graded-Channel MOSFETs

    Emam, Mostafa[UCL] Pavanello, M.A. Danneville, François Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2010) 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics” — Kyiv, Ukraine
23. • Speech

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    High Resistivity SOI wafer: the substrate for RF SoC applications?

    Raskin, Jean-Pierre[UCL] (2010) 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics” — Kyiv, Ukraine
24. • Speech

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    Miniaturized and low cost innovative detection systems for medical and environmental applications

    Moreno Hagelsieb, Luis[UCL] Nizet, Yannick[UCL] Tang, Xiaohui[UCL] Bulteel, Olivier[UCL] Van Overstaeten-Schlögel, Nancy[UCL] André, Nicolas[UCL] Dupuis, Pascal[UCL] Raskin, Jean-Pierre[UCL] Fontayne, P.A.[UCL] Gala, Jean-Luc[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] (2010) IEEE 2nd Circuits and Systems for Medical and Environmental Applications Workshop - CASME 2010 — Merida (Yucatan/Mexico)
25. • Speech

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    Special Features of the Back-Gate Effects in UTB SOI MOSFETs

    Rudenko, T. Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] Andrieu, F. Faynot, O. Le Tiec, Y. Landry, K. Nazarov, A. Flandre, Denis[UCL] (2010) 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics” — Kyiv, Ukraine

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