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Displaying 21 results.
    • Journal article
    Impact of crosstalk into high resistivity silicon substrate on the RF performance of SOI MOSFET
    Ben Ali, Khaled[UCL] Roda Neve, Cesar[UCL] Gharsallah, A. Raskin, Jean-Pierre[UCL] (2010) Journal of Telecommunications and Information Technology — Vol. 4, p. 93-100 (2010)
    • Journal article
    New RF series extrinsic resistances extraction procedure for deep-submicron MOS transistors
    Tinoco, J.C. Raskin, Jean-Pierre[UCL] (2010) International Journal of Numerical Modelling: Electronic Networks, Devices and Fields — Vol. 23, no. 2, p. 107-126 (2010)
    • Journal article
    PECVD oxide as intermediate film for wafer bonding : impact of residual stress
    Olbrechts, Benoit[UCL] Raskin, Jean-Pierre[UCL] (2010) Microelectronic Engineering — Vol. 87, no. 11, p. 2178-2186 (November 2010)
    • Journal article
    A fast and robust algorithm to assess respiratory frequency in real-time
    Dupuis, Pascal[UCL] André, Nicolas[UCL] Gérard, Pierre[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] (2010) Procedia Engineering — Vol. 5, p. 576-579 (2010)
    • Journal article
    Ultra Low Power flow-to-frequency SOI MEMS transducer
    André, Nicolas[UCL] Rue, Bertrand[UCL] Van Vynckt, D.[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2010) Procedia Engineering — Vol. 5, p. 540-543 (2010)
    • Journal article
    Imperfection-sensitive ductility of aluminium thin films
    Coulombier, Michaël[UCL] Boe, Alexandre[UCL] Brugger, C.[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2010) Scripta Materialia — Vol. 62, no. 10, p. 742-745 (2010)
    • Journal article
    Thermal Noise in MOSFETs: A Two- or a Three-Parameter Noise Model?
    Emam, Mostafa[UCL] Sakalas, Paulius Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] Lim, Tao Chuan Danneville, Francois (2010) IEEE Transactions on Electron Devices — Vol. 57, no. 5, p. 1188-1191 (2010)
    • Journal article
    Ductility of thin metallic films
    Pardoen, Thomas[UCL] Coulombier, Michaël[UCL] Boe, Alexandre[UCL] Safi, A. Brugger, Charles[UCL] Ryelandt, Sophie[UCL] Carbonnelle, Pierre[UCL] Gravier, Sébastien[UCL] Raskin, Jean-Pierre[UCL] (2010) Materials Science Forum — Vol. 633-634, p. 615-635 (2010)
    • Journal article
    Accurate prediction of the volume inversion impact on undoped Double Gate MOSFET capacitances
    Moldovan, O. Chaves, F.A. Jime nez, D. Raskin, Jean-Pierre[UCL] Iniguez, B. (2010) International Journal of Numerical Modelling: Electronic Networks, Devices and Fields — Vol. 23, no. 6, p. 447-457 (2010)