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Displaying 18 results.
    • Journal article
    CMOS compatible anodic Al2O3 based sensors for bacteria detection
    Moreno-Hagelsieb, L. Nizet, Y. Tang, Xiaohui[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Francis, Laurent[UCL] (2009) Procedia Chemistry — Vol. 1, p. 1283-1286 (2009)
    • Journal article
    Experimental evidence of MOSFET high frequency noise reduction by channel engineering
    Emam, M. Sakalas, P. Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] Lim, T. Danneville, F. (2009) IEEE Transactions on Electron Devices — Vol. 56, no.7, p. 1516-1522 (2009)
    • Journal article
    SOI technology: an opportunity for RF designers? (invited paper)
    Raskin, Jean-Pierre[UCL] (2009) Journal of Telecommunications and Information Technology — , no. 4, p. 3-17 (April 2009)
    • Journal article
    The impact of externally applied mechanical stress on analog and RF performances of SOI MOSFETs
    Emam, Mostafa[UCL] Houri, Samer[UCL] Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2009) Journal of Telecommunications and Information Technology — no. 4, p. 18-24 (2009)
    • Journal article
    Messung der 3D-Topographie von Sensoren in Mikrosystemtechnik
    André, Nicolas[UCL] Sobieski, Stanislas[UCL] Francis, Laurent[UCL] Raskin, Jean-Pierre[UCL] (2009) MessTec — no. 01-02, p. 22 (2009)
    • Journal article
    Mechanical properties of anodic aluminum oxide for MEMS applications
    Moreno Hagelsieb, Luis[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2009) Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures — Vol. 27, no.1, pp. 542-546 (2009)
    • Journal article
    Bulk and surface micromachined MEMS in thin film SOI technology
    Raskin, Jean-Pierre[UCL] (2009) Advanced Substrate News — Vol. ASN 12, no. Spring 2009, p. 5 pages (2009)
    • Journal article
    Effect of geometrical nonlinearity on MEMS thermoelastic damping
    Mendez, C.[UCL] Paquay, S. Klapka, I. Raskin, Jean-Pierre[UCL] (2009) Nonlinear Analysis: Real World Applications — Vol. 10, no. 3, p. 1579-1588 (2009)
    • Journal article
    Internal stress relaxation based method for elastic stiffness characterization of very thin films
    Boe, Alexandre[UCL] Safi, A.[UCL] Coulombier, Michaël[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2009) Thin Solid Films — Vol. 518, no. 1, p. 260-264 (2009)
    • Journal article
    Schottky barrier lowering with the formation of crystalline Er silicide on n-Si upon thermal annealing
    Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Bayot, Vincent[UCL] Yarekha, Dmitri A. Dubois, Emmanuel Godey, Sylvie Wallart, Xavier Larrieu, Guilhem Laszcz, Adam Ratajczak, Jacek Jacques, Pascal[UCL] Raskin, Jean-Pierre[UCL] (2009) Applied Physics Letters — Vol. 94, no. 19 (2009)
    • Journal article
    MEMS-based microstructures for nanomechanical characterization of thin films
    Boe, Alexandre[UCL] Safi, A.[UCL] Coulombier, Michaël[UCL] Fabregue, D. Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2009) Smart Materials and Structures — Vol. 18, no. 11 (2009)
    • Journal article
    A Simple Method for Measuring Si-Fin Sidewall Roughness by AFM
    Tang, Xiaohui[UCL] Bayot, Vincent[UCL] Reckinger, Nicolas[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Dubois, Emmanuel Nysten, Bernard[UCL] (2009) IEEE Transactions on Nanotechnology — Vol. 8, no. 5, p. 611-616 (2009)
    • Journal article
    Experimental Investigation of RF Noise Performance Improvement in Graded-Channel MOSFETs
    Emam, Mostafa[UCL] Sakalas, Paulius Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] Lim, Tho Chuan Danneville, Francois (2009) IEEE Transactions on Electron Devices — Vol. 56, no. 7, p. 1516-1522 (2009)
    • Journal article
    An electrical evaluation method for the silicidation of silicon nanowires
    Tang, Xiaohui[UCL] Flandre, Denis[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] Dubois, Emmanuel Yarekha, D. A. Larrieu, Guilhem Lecestre, A. Ratajczak, J. Breil, N. Passi, Vikram[UCL] Raskin, Jean-Pierre[UCL] (2009) Applied Physics Letters — Vol. 95, no. 2 (2009)
    • Journal article
    New On-Chip Nanomechanical Testing Laboratory - Applications to Aluminum and Polysilicon Thin Films
    Gravier, Sebastien Coulombier, Michaël[UCL] Safi, Asmahan André, Nicolas[UCL] Boe, Alexandre[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2009) IEEE Journal of Microelectromechanical Systems — Vol. 18, no. 3, p. 555-569 (2009)
    • Journal article
    Optimization of RF Performance of Metallic Source/Drain SOI MOSFETs Using Dopant Segregation at the Schottky Interface
    Valentin, Raphael Dubois, Emmanuel Larrieu, Guilhem Raskin, Jean-Pierre[UCL] Dambrine, Gilles Breil, Nicolas Danneville, Francois (2009) IEEE Electron Device Letters — Vol. 30, no. 11, p. 1197-1199 (2009)
    • Journal article
    Temperature Effect on Lorentz Based Magnetometer
    Sobieski, Stanislas[UCL] André, Nicolas[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] (2009) Sensor Letters — Vol. 7, no. 3, p. 456-459 (2009)
    • Journal article
    Direct protein detection with a nano-interdigitated array gate MOSFET.
    Tang, Xiaohui[UCL] Jonas, Alain M.[UCL] Nysten, Bernard[UCL] Demoustier-Champagne, Sophie[UCL] Blondeau, Françoise[UCL] Prévot, Pierre-Paul[UCL] Pampin, Rémi[UCL] Godfroid, Edmond Iñiguez, Benjamin Colinge, Jean-Pierre Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Bayot, Vincent[UCL] (2009) Biosensors & bioelectronics — Vol. 24, no. 12, p. 3531-7 (2009)