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Displaying 14 results.
    • Speech
    Compact Model for Single Event Transients and Total Dose Eects at High Temperatures for Partially Depleted SOI MOSFETs
    Alvarado Pulido, José Joaquin[UCL] Kilchytska, Valeriya[UCL] Boufouss, El Hafed[UCL] Flandre, Denis[UCL] (2010) 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2010) — Gaeta
    • Speech
    Effects of high–energy neutrons on advanced SOI MOSFETs
    Kilchytska, Valeriya[UCL] Alvarado, Jose Joaquin[UCL] Militaru, O.[UCL] Berger, G.[UCL] Flandre, Denis[UCL] (2010) 6th International SemOI Workshop "Nanoscaled Semiconductor-on-Insulator Materials, Sensors and Devices", — Kiev (Ukraine)
    • Speech
    3D Simulation of Triple-Gate MOSFETs
    Conde, J. Cerdeira, A. Pavanello, M. Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2010) Proceedings of MIEL 2010, the 27th International Conference on Microelectronics Proceedings — Nis/Serbia
    • Speech
    Total-Dose Effects Caused by High-Energy Neutrons and gamma-Rays in Multiple-Gate FETs
    Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Alvarado, Joaquin[UCL] Collaert, Nadine[UCL] Rooyakers, R. Militaru, Otilia[UCL] Berger, Guy[UCL] (2010) 10th European Conference on Radiation and Its Effects on Components and Systems (RADECS - 09) — Bruges (Belgium)
    • Speech
    Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
    Kilchytska, Valeriya[UCL] Alvarado Pulido, José Joaquin[UCL] Collaert, N. Rooyakers, R. Put, S. Claeys, C. Flandre, Denis[UCL] (2010) Sixth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2010) — Grenoble (France)
    • Speech
    Effect of high-energy neutrons on MuGFETs
    Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Alvarado, Joaquin[UCL] Collaert, Nadine[UCL] Rooyakers, R.[UCL] Militaru, Otilia[UCL] Berger, Guy[UCL] (2010) 5th Workshop of the Thematic-Network-on-Silicon-on-Insulator-Technology-Devices-and-Circuits (EUROSOI 2009) — Chalmers Univ Technol, Gothenburg (Sweden)
    • Speech
    Modeling of main leakage currents and their contribution to channel current in Fin-FETs
    Garduno, I. Cerdeira, A. Estrada, M. Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2010) 2010 27th International Conference on Microelectronics (MIEL 2010) — Nis, Serbia
    • Speech
    High-energy neutrons effect on strained and non-strained SOI MuGFETs and planar MOSFETs
    Kilchytska, Valeriya[UCL] Alvarado Pulido, José Joaquin[UCL] Put, S. Collaert, N. Simoen, E. Claeys, C. Militaru, Otilia[UCL] Berger, Guy[UCL] Flandre, Denis[UCL] (2010) 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2010) — Gaeta (Italy)
    • Speech
    Experimental study of transconductance and mobility behaviors in ultra-thin SOI MOSFETs with standard and thin buried oxides
    Rudenko, T. Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Burignat, S.[UCL] Raskin, Jean-Pierre[UCL] Andrieu, F. Faynot, O. Le Tiec, Y. Landry, K. Nazarov, A. Lysenko, V. S. (2010) 5th Workshop of the Thematic-Network-on-Silicon-on-Insulator-Technology-Devices-and-Circuits (EUROSOI 2009) — Chalmers Univ Technol, Gothenburg (Sweden)
    • Speech
    Special Features of the Back-Gate Effects in UTB SOI MOSFETs
    Rudenko, T. Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] Andrieu, F. Faynot, O. Le Tiec, Y. Landry, K. Nazarov, A. Flandre, Denis[UCL] (2010) 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics” — Kyiv, Ukraine
    • Speech
    Substrate impact on threshold voltage and subthreshold slope of sub-32 nm ultra thin SOI MOSFETs with thin buried oxide and undoped channel
    Burignat, S.[UCL] Flandre, Denis[UCL] Arshad, M. K.[UCL] Kilchytska, Valeriya[UCL] Andrieu, F. Faynot, O. Raskin, Jean-Pierre[UCL] (2010) 5th Workshop of the Thematic-Network-on-Silicon-on-Insulator-Technology-Devices-and-Circuits (EUROSOI 2009) — Chalmers Univ Technol, Gothenburg(Sweden)
    • BookChapter
    Wide Frequency Band Characterization
    Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2010) Nanoscale CMOS: Innovative Materials, Modeling and Characterization —