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Displaying 22 results.
    • Journal article
    Inferring ejection distances and a surface energy profile in keV particle bombardment experiments
    Delcorte, Arnaud[UCL] Segda, BG Garrison, BJ Bertrand, Patrick[UCL] (2000) Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms — Vol. 171, no. 3, p. 277-290 (2000)
    • Journal article
    "Matrix" effects in ToF-SIMS analyses of styrene-methyl methacrylate random copolymers
    Vanden Eynde, X Bertrand, Patrick[UCL] Penelle, J. (2000) Macromolecules — Vol. 33, no. 15, p. 5624-5633 (2000)
    • Journal article
    Diffusion of an adhesion promoter (chlorinated polypropylene) into polypropylene/ethylene-propylene copolymer (PP/EP) blends: method of quantification
    Tomasetti, E Legras, Roger[UCL] Vandorpe, S Daoust, Daniel[UCL] Boxus, T Marchand-Brynaert, Jacqueline[UCL] Poleunis, Claude[UCL] Bertrand, Patrick[UCL] Rouxhet, Paul[UCL] (2000) Journal of Adhesion Science and Technology : the international journal of theoretical and basic aspects of adhesion science and its applications in all areas of technology — Vol. 14, no. 6, p. 779-789 (2000)
    • Speech
    Combining TOF-SIMS with XPS and AFM to quantify organic surface coverages
    Kenens, C. conard, T. Hellemans, L. Bertrand, Patrick[UCL] Vandervorst, W. (2000) 12th International Conference on Secondary Ion Mass Spectrometry and Related Topics, SIMS XII — Brussels, Belgium
    • Journal article
    O-2 reduction in PEM fuel cells: Activity and active site structural information for catalysts obtained by the pyrolysis at high temperature of Fe precursors
    Lefevre, M. Dodelet, JP. Bertrand, Patrick[UCL] (2000) The Journal of Physical Chemistry Part B: Materials, Surfaces, Interfaces & Biophysical — Vol. 104, no. 47, p. 11238-11247 (2000)
    • Speech
    Albumin adsorption on polycarbonate : correlation between XPS and TOF-SIMS analyses
    Rouxhet, Laurence[UCL] Bertrand, Patrick[UCL] (2000) 12th International Conference on Secondary Ion Mass Spectrometry and Related Topics, SIMS XII — Brussels, Belgium
    • Journal article
    ToF-SIMS and XPS study of sulphur on carbon black surface
    Poleunis, Claude[UCL] Vanden Eynde, X Grivei, E. Smet, H Probst, N. Bertrand, Patrick[UCL] (2000) Surface and Interface Analysis — Vol. 30, no. 1, p. 420-424 (2000)
    • Journal article
    Carbon black and fullerenes: New discoveries in early formation mechanisms and nucleation
    Johnson, MP Locke, RW Donnet, JB Wang, TK Wang, CC Bertrand, Patrick[UCL] (2000) Rubber Chemistry and Technology — Vol. 73, no. 5, p. 875-888 (2000)
    • Journal article
    Kiloelectronvolt particle-induced emission and fragmentation of polystyrene molecules adsorbed on silver: Insights from molecular dynamics
    Delcorte, Arnaud[UCL] Vanden Eynde, X.[UCL] Bertrand, Patrick[UCL] Vickerman, J.C. Garrison, B.J. (2000) The Journal of Physical Chemistry Part B: Materials, Surfaces, Interfaces & Biophysical — Vol. 104, no. 12, p. 2673-2691 (2000)
    • Speech
    Invited talk : Fundamental aspects in SIMS of complex molecules
    Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Vickerman, J. C. Garrison, B.J. (2000) 11th International Conference on Quantitative Surface Analysis — Guildford (England)
    • BookChapter
    Substrate and structural effects on the kinetic energy of molecular fragments in SIMS of polymer overlayers
    Arezki, B.[UCL] Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] (2000) Secondary Ion Mass Spectrometry, SIMS XII proceedings — [ISBN : 0-444-50323-4]
    • Contribution à ouvrage collectif (Book Chapter)
    Functionalities of a Fe-based catalyst evidenced by TOF-SIMS in relation with the electroreduction of Oxygen in polymer fuell cells
    Lefèvre, Michel Dodelet, J.P. Bertrand, Patrick[UCL] (2000) Secondary Ion Mass Spectrometry, SIMS XII — [ISBN : 0-444-50323-4]
    • Contribution à ouvrage collectif (Book Chapter)
    TOF-SIMS analysis of the molecular weight distribution of polyacrylonitrile synthesized by electropolymerization
    Poleunis, Claude[UCL] Bertrand, Patrick[UCL] Baute, N Jérôme, R. (2000) Secondary Ion Mass Spectrometry, SIMS XII — [ISBN : 0-444-50323-4]
    • Contribution à ouvrage collectif (Book Chapter)
    Ion beam patterned polymer surfaces for selective polyelectrolyte multilayer build-up
    Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Wischerhoff, Erik[UCL] Laschewsky, André[UCL] (2000) Secondary Ion Mass Spectrometry, SIMS XII — [ISBN : 0-444-50323-4]