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Displaying 6 results.
    • Journal article
    Dynamic threshold voltage MOS in partially depleted SOI technology: a wide frequency band analysis
    Dehan, Morin[UCL] Raskin, Jean-Pierre[UCL] (2005) Solid-State Electronics — Vol. 49, no. 1, p. 67-72 (2005)
    • Journal article
    Effective resistivity of fully-processed SOI substrates
    Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2005) Solid-State Electronics — Vol. 49, no. 3, p. 491-496 (2005)
    • Journal article
    Low-cost optical instrumentation for thermal characterization of MEMS
    Jorez, S. Laconte, J. Cornet, Alain[UCL] Raskin, Jean-Pierre[UCL] (2005) Measurement Science and Technology — Vol. 16, no. 9, p. 1833-1840 (2005)
    • Journal article
    High performance analog operation of double gate transistors with the graded-channel architecture at low temperatures
    Pavanello, Marcelo Antonio Flandre, Denis[UCL] Martino, Joao Antonio Raskin, Jean-Pierre[UCL] (2005) Solid-State Electronics — Vol. 49, no. 10, p. 1569-1575 (2005)
    • Journal article
    SOI-CMOS compatible low-power gas sensor using sputtered and drop-coated metal-oxide active layers
    Ivanov, P. Laconte, J.[UCL] Raskin, Jean-Pierre[UCL] Stankova, M. Sotter, E. Llobet, E. Vilanova, X. Flandre, Denis[UCL] Correig, X. (2005) Microsystem Technologies : micro and nanosystems - information storage and processing systems — Vol. 12, no. 1-2, p. 160-168 (2005)
    • Journal article
    FinFET analogue characterization from DC to 110 GHz
    Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Rudenko, Tamara Collaert, Nadine[UCL] Flandre, Denis[UCL] Dixit, A. De Meyer, K. Raskin, Jean-Pierre[UCL] (2005) Solid-State Electronics — Vol. 49, no. 9, p. 1488-1496 (September 2005)