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Displaying 18 results.
    • Journal article
    A dynamic study for wafer-level bonding strength uniformity in low-temperature wafer bonding
    Zhang, XX Raskin, Jean-Pierre[UCL] (2005) Electrochemical and Solid-State Letters — Vol. 8, no. 10, p. G268-G270 (2005)
    • Journal article
    Analysis on the improved analog performance on double gate transistors by using the graded-channel architecture in a wide temperature range
    Pavanello, M.A. Martino, J.A. Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2005) Solid-State Electronics, Elsevier Science, Pergamon — Vol. 49, no. 10, p. 1569-1575 (October)
    • Journal article
    A dynamic study for wafer-level bonding strength uniformity in low temperature wafer bonding
    Zhang, Xuan Xiong[UCL] Raskin, Jean-Pierre[UCL] (2005) Electrochemical and Solid-State Letters — Vol. 8, no. 10, p. G268-G270 (October)
    • Journal article
    One-mask CMOS compatible process for the fabrication of three-dimensional self-assembled thin-film SOI microelectromechanical systems
    Iker, François[UCL] André, Nicolas[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2005) Electrochemical and Solid-State Letters — Vol. 8, no. 10, p. H87-H89 (2005)
    • Journal article
    Gate length scaling and microwave performance of double gate nanotransistors
    Kranti, Abhinav[UCL] Chung, Tsung Ming[UCL] Raskin, Jean-Pierre[UCL] (2005) International Journal of Nanoscience — Vol. 4, no.5-6, pp. 1021-1024 (October-December 2005)
    • Journal article
    Potential and modeling of 1-mM SOI CMOS operational transconductance amplifiers for applications up to 1 GHz
    Eggermont, Jean-Paul[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Colinge, Jean-Pierre[UCL] (2005) IEEE Journal of Solid State Circuits — Vol. 33, no. 4, p. 640-646 (April)
    • Journal article
    Extended low-temperature plasma-assisted bonding enhances wafer bonding strength uniformity
    Zhang, Xiaodong[UCL] Raskin, Jean-Pierre[UCL] (2005) MRS Bulletin — Vol. 30, no.Issue 10, pp. 688-689 (October 2005)
    • Journal article
    Accurate effective mobility extraction by split C-V technique in SOI MOSFETs: Suppression of the influence of floating-body effects
    Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Lederer, Dimitri[UCL] Collaert, Nadine Raskin, Jean-Pierre[UCL] (2005) IEEE Electron Device Letters — Vol. 26, no. 10, p. 749-751 (2005)
    • Journal article
    Liquid and vapor phase silanes coating for the release of thin film MEMS
    Parvais, Bertrand[UCL] Pallandre, A. Jonas, Alain M.[UCL] Raskin, Jean-Pierre[UCL] (2005) IEEE Transactions on Device and Materials Reliability — Vol. 5, no. 2, p. 250-254 (2005)
    • Journal article
    Solutions for an electrical DNA detection
    Laurent, Géry[UCL] Raskin, Jean-Pierre[UCL] Huynen, Isabelle[UCL] (2005) Belgian Journal of Electronics and Communications (Revue HF Tijdschrift) — Vol. 1, p. 67-68 (2005)
    • Journal article
    High frequency degradation of body-contacted PD SOI MOSFET output conductance
    Lederer, Dimitri[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2005) Semiconductor Science and Technology — Vol. 20, no. 5, p. 469-472 (2005)
    • Journal article
    Analysis of static and dynamic performance of short-channel double-gate silicon-on-insulator metal-oxide-semiconductor field-effect transistors for improved cutoff frequency
    Kranti, A. Chung, TN Raskin, Jean-Pierre[UCL] (2005) Japanese Journal of Applied Physics. Part 2, Letters & Express Lettres — Vol. 44, no. 4B, p. 2340-2346 (2005)
    • Journal article
    Analysis of quasi double gate method for performance prediction of deep submicron double gate SOI MOSFETs
    Kranti, Abhinav[UCL] Flandre, Denis[UCL] Chung, TM[UCL] Raskin, Jean-Pierre[UCL] (2005) Semiconductor Science and Technology — Vol. 20, no. 5, p. 423-429 (2005)
    • Journal article
    Behavior of a common source traveling wave amplifier versus temperature in SOI technology
    Si Moussa, M. Pavageau, C. Danneville, F. Russat, J. Fel, N. Raskin, Jean-Pierre[UCL] Vanhoenacker-Janvier, Danielle[UCL] (2005) European Microwave Association. Proceedings — Vol. 1, p. 288-292 (2005)
    • Journal article
    Low-temperature wafer bonding: A study of void formation and influence on bonding strength
    Zhang, XX Raskin, Jean-Pierre[UCL] (2005) IEEE Journal of Microelectromechanical Systems — Vol. 14, no. 2, p. 368-382 (2005)
    • Journal article
    New substrate passivation method dedicated to HR SOI wafer fabrication with increased substrate resistivity
    Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2005) IEEE Electron Device Letters — Vol. 26, no. 11, p. 805-807 (2005)
    • Journal article
    Non-linear performance comparison for FD and PD SOI MOSFETs based on the integral function method and Volterra modelling
    Parvais, Bertrand[UCL] Cerdeira, A. Schreurs, D. Raskin, Jean-Pierre[UCL] (2005) International Journal of Numerical Modelling: Electronic Networks, Devices and Fields — Vol. 18, no. 4, p. 283-296 (2005)
    • BookChapter
    Temperature dependence of RF losses in HR SOI substrates
    Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2005) Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environmen — [ISBN : 978-1-4020-3012-3]