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Displaying 1 - 25 of 58 results.
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(2011) 10th National Day on Biomedical engineering and annual symposium of the IEEE EMBS Benelux Chapter — Gent, Belgium -
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(2011) 26th European Photovoltaic solar energyconference — Hambourg (Allemagne) -
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(2011) Advances in Photodiodes — [ISBN : 978-953-307-163-3] -
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(2011) Proceedings of SOI Conference 2011 — Tempe (USA) -
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(2011) 30th Annual International Conference on the Theory and Applications of Cryptographic Techniques — Tallinn, Estonia -
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(2011) 219th ECS Meeting — Montréal (Canada) -
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(2011) Transducers 2011 — Beijing (China) -
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(2011) International Conference and Exhibition on High Temperature Electronics Network (HiTEN) — Oxford (Royaume-Uni) -
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(2011) IEEE International SOI Conference (SOI 2011) — Tempe (USA) -
- Journal article
(2011) IEEE Journal on Emerging and Selected Topics in Circuits and Systems — Vol. 1, no. 2, p. 141-149 (Juillet 2011) -
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(2011) Seventh Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2011) — Granada (Espagne) -
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(2011) IEEE International SOI Conference (SOI 2011) — Tempe (USA) -
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(2011) The Second International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications (ANIMMA’11) — Ghent (Belgium) -
- BookChapter
(2011) Biomedical Engineering, Trends in Electronics, Communications and Software — [ISBN : 978-953-307-475-7] -
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(2011) VARI Workshop on CMOS Variability — Grenoble (France) -
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(2011) International Bio-Sensing Technology Conference (BITE) — Amsterdam (Pays-Bas) -
- Journal article
(2011) Journal of Integrated Circuits and Systems — Vol. 6, no. 1, p. 107-113 (2011) -
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(2011) IEEE International SOI Conference (SOI 2011) — Tempe (USA) -
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(2011) Proceedings de FTFC 2011, Faible Tension Faible Consommation — Marrakech (Maroc) -
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(2011) IEEE Subthreshold Microelectronics Conference — Lexington (USA) -
- BookChapter
(2011) Semiconductor-On-Insulator Materials for Nano-Electronics Applications — [ISBN : 978-3-642-15867-4] -
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(2011) Ultimate Integration of Silicon Conference (ULIS) — Cork (Irlande) -
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(2011) 22nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis — Bordeaux -
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(2011) CHES 2011 — Nara (Japan) -
- Journal article
(2011) Journal of Applied Physics — Vol. 109, no. 8 (15 avril 2011)