Accès à distance ? S'identifier sur le proxy UCLouvain
Displaying 1 - 25 of 64 results.
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(2008) 9th International Balkan Workshop on Applied Physics – IBWAP’08 — Constanta (Romania) -
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(2008) IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - SiRF 2008 — Orlando, Florida, USA -
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(2008) MOS-AK Workshop – MOS modeling and parameter extraction working group — Eindhoven, The Netherlands -
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(2008) 11th Session Nanoscale CMOS and Si-based Beyond CMOS Nanodevices - MIGAS’08 — Grenoble, France -
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(2008) Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’08 — Cork, Ireland -
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(2008) Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’08 — Cork, Ireland -
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(2008) European Materials Research Society – E-MRS 2008 Spring Meeting — Strasbourg, France -
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(2008) European Magnetic Sensors & Actuators Conference - EMSA 2008 — Caen (France) -
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(2008) First International Conference on Functional Nanocoatings — Budapest, Hungary -
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(2008) 2nd International Conference on Integration and Commercialization of Micro and Nanosystems 2008 — Clear Water Bay, Kowloon, Hong Kong, China -
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(2008) ECS Transactions — Vol. 16, no. 8, p. 165-174 (2008) -
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(2008) IEEE Transactions on Electron Devices — Vol. 55, no. 5, p. 1192-1202 (2008) -
- Journal article
(2008) Nanotechnology — Vol. 19, no. 16, p. 165703 (2008) -
- Journal article
(2008) IEEE Transactions on Microwave Theory and Techniques — Vol. 56, no. 3, p. 587-598 (2008) -
- Journal article
(2008) Applied Surface Science — Vol. 254, no. 19, p. 6168-6173 (2008) -
- Journal article
(2008) Materials Science in Semiconductor Processing — Vol. 11, no. 5-6, p. 148-159 (2008) -
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(2008) 19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis — Maastricht(Netherlands) -
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(2008) Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’08 — Tyndall National Institute, Cork, Ireland -
- Journal article
(2008) ECS Transactions — Vol. 13, no. 2, p. 83-90 (February 2008) -
- Journal article
(2008) Polytec InFocus - Optical Measurement Solutions — no. 2, p. 22-23 (February 2008) -
- Journal article
(2008) IEEE Electronic Device Letters — Vol. 29, no. 4, p. 396-398 (April 2008) -
- Journal article
(2008) Proceedings of the European Microwave Association — Vol. 4, p. 199-205 (June 2008) -
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(2008) IEEE International SOI Conference - SOI'2008 — Hudson River Valley, New York, USA -
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(2008) 34th International Conference on Micro- and Nano-Engineering - MNE 2008 — Athens (Greece)