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Displaying 18 results.
    • Speech
    Lab-on-chip for testing thin film materials: extraction of mechanical and electrical properties under large deformation at the nanometer scale
    Coulombier, Michaël[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2016) Third Winfab Scientific Day — UCL, Louvain-la-Neuve (Belgium)
    • Speech
    Strain engineering of ZnO thin films deposited by DC reactive sputtering
    Tuyaerts, R. Raskin, Jean-Pierre[UCL] Proost, J. (2016) Third Winfab Scientific Day — UCL, Louvain-la-Neuve (Belgium)
    • Speech
    Size dependent mechanical behavior and nanoscale plasticity mechanisms in highly ductile zr65ni35 metallic glass films
    Idrissi, Hosni[UCL] Ghidelli, Matteo[UCL] Gravier, Sébastien Blandin, Jean-Jacques Raskin, Jean-Pierre[UCL] Schryvers, Dominique Pardoen, Thomas[UCL] (2016) EMMC15, 15th European Mechanics of Materials Conference — Brussels, Belgium
    • Speech
    Advanced TEM Study of Homogeneous Flow and Size Dependent Mechanical Behaviour in Highly Ductile Zr65Ni35 Metallic Glass Films
    Idrissi, Hosni[UCL] Ghidelli, Matteo[UCL] Gravier, Sébastien Blandin, Jean-Jacques Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Schryvers, Dominique (2016) MRS Fall Meeting 2016 — Boston, MA, USA
    • Speech
    Recent investigation of small-scale plasticity mechanisms in 3D and small-sized systems using advanced in-situ TEM nanomechanical testing
    Idrissi, Hosni[UCL] Ghidelli, M.[UCL] Gravier, S. Blandin, J.J. Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Schryvers, D. (2016) European Microscopy Conference (EMC2016) — Lyon, France
    • Speech
    A hybrid graphene-metal oxide sensor for formaldehyde detection at room temperature
    Tang, Xiaohui[UCL] Debliquy, Marc Lahem, Driss Flandre, Denis[UCL] André, Nicolas[UCL] Walewyns, Thomas[UCL] Francis, Laurent[UCL] Raskin, Jean-Pierre[UCL] (2016) 2016 13th International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2016) — Beijing (China)
    • Journal article
    Parasitic gate resistance impact on Triple Gate FinFET CMOS inverter
    Solis Avila, Edgard Tinoco, Julio C. Martinez-Lopez, Andre Reyes-Barranca , Mario Alfredo Cerdeira, Antonio Raskin, Jean-Pierre[UCL] (2016) IEEE Transactions on Electron Devices — Vol. 63, no.7, p. 2635-2642 (May 2016)
    • Speech
    Ultra-low-power 130nm SOI CMOS smart sensor for in-situ mechanical stress in SiP and SoC applications
    Al Kadi Jazairli, Mohamad[UCL] André, Nicolas[UCL] Tooten, Ester[UCL] Olbrechts, Benoit[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2016) 14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics - Experiment and Simulation (IRSP 2016) — Bad Schandau (Germany)
    • Journal article
    Automated Design of a 13.56 MHz 19µW Passive Rectifier With 72% Efficiency Under 10µA load
    Haddad, Pierre-Antoine[UCL] Gosset, Geoffroy Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2016) IEEE Journal of Solid State Circuits — Vol. 51, no.5, p. 12 (05/2015)
    • Speech
    RF SOI CMOS Technology on 1st and 2nd Generation Trap-Rich High Resistivity SOI Wafers
    Kazemi Esfeh, Babak[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2016) 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2016) — Vienne (Austria)
    • Journal article
    A novel on chip test method to characterize the creep behavior of metallic layers under heavy ion irradiation
    Lapouge, Pierre Onimus, Fabien Vayrette, Renaud[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Bréchet, Yves (2016) Journal of Nuclear Materials — Vol. 476, p. 20-29 (2016)
    • Journal article
    Surveying colloid sedimentation by coplanar waveguides
    Dutu, Constantin Augustin[UCL] Vlad, Alexandru[UCL] Roda Neve, Cesar Avram, Ionel[UCL] Sandu, Georgiana[UCL] Raskin, Jean-Pierre[UCL] Melinte, Sorin[UCL] (2016) Nanotechnology — Vol. 27, p. 225502 (2016)
    • Speech
    Coplanar waveguide devices: Surveying nanocolloid dynamics
    Dutu, Constantin Augustin[UCL] Vlad, Alexandru[UCL] Roda Neve, Cesar Avram, Ionel[UCL] Sandu, Georgiana[UCL] Raskin, Jean-Pierre[UCL] Melinte, Sorin[UCL] (2016) E-MRS Spring Meeting — Lille (France)
    • Journal article
    Semiconductor- to metallic-like behavior in Bi thin films on KCl substrate
    Bui, Thanh Nhan[UCL] Raskin, Jean-Pierre[UCL] Hackens, Benoît[UCL] (2016) Journal of Applied Physics — Vol. 119, no.13, p. 135304 (2016)
    • Journal article
    The role of SiC as a diffusion barrier in the formation of graphene on Si(111)
    Pham, Trung T. Santos, Cristiane N.[UCL] Joucken, Frédéric Hackens, Benoît[UCL] Raskin, Jean-Pierre[UCL] Sporken, Robert (2016) Diamond and Related Materials — Vol. 66, no.0925-9635, p. 141-148 (2016)
    • Journal article
    A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects
    Pardoen, Thomas[UCL] Colla, Marie-Stéphane[UCL] Idrissi, Hosni[UCL] Amin-Ahmadi, Behnam Wang, Binjie Schryvers, Dominique Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] (2016) Comptes rendus. Physique — Vol. 17, no.3-4, p. 485-495 (2016)
    • Speech
    Automated design of a 13.56 MHz Corner-robust Efficient Differential Drive Rectifier for 10 μA load
    Haddad, Pierre-Antoine[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2016) 2016 IEEE International Symposium on Circuits and Systems (ISCAS) — Montréal (Canada)
    • Journal article
    Size dependent fracture strength and cracking mechanisms in freestanding polycrystalline silicon films with nanoscale thickness
    Vayrette, Renaud[UCL] Galceran, M. Coulombier, Michaël[UCL] Godet, S. Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2016) Engineering Fracture Mechanics — Vol. 168, p. 190-203 (2016)