User menu

Accès à distance ? S'identifier sur le proxy UCLouvain

Search

Displaying 1 - 25 of 38 results.

Pages

    • Speech
    On a chip MEMS based mechanical testing
    Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] Coulombier, Michaël[UCL] Jaddi, Sahar[UCL] Ghidelli, Matteo Vayrette, Renaud Idrissi, Hosni[UCL] (2018) Workshop on stress in microelectronics — Leuven, Belgium
    • Speech
    IngénieuxSud: Educate Engineers for Acting in a Complex and Intercultural Environment
    Raskin, Jean-Pierre[UCL] Merle, Stéphanie[UCL] (2018) 2018 International Conference UNESCO Chair in Technologies for Development – Voices of the Global South — EPFL, Lausanne (Switzerland)
    • Speech
    Un escape game pour préparer des étudiants de master au stage en entreprise
    Vangrunderbeeck, P. Malcourant, E. Lecoq, J. Ducarme, D. Raskin, Jean-Pierre[UCL] (2018) Colloque AUPTIC.education 2018 - Les technologies au service du pédagogique — Bienne (Suisse)
    • Speech
    No digital society without sustainable information technology
    Raskin, Jean-Pierre[UCL] (2018) Symposium HERA – Transmettre un monde habitable pour les générations futures : l’apport de la recherche — University of Mons (Belgium)
    • Speech
    RF characterization and modelling of SOI MOSFETs
    Raskin, Jean-Pierre[UCL] (2018) SINANO Multi-Scale Modelling Summer School — Universitat Rovira i Virgili, Tarragona (Spain)
    • Speech
    Current status and trends in RF silicon-on-insulator material and device
    Raskin, Jean-Pierre[UCL] (2018) Symposium on advanced CMOS-compatible semiconductor devices 18 - 233rd ECS meeting — Seattle
    • Journal article
    Extrinsic gate capacitance compact model for UTBB MOSFETs
    Martinez-Lopez, Andrea G Tinoco, Julio C Lezama, Gamaliel Conde, Jorge E Kazemi Esfeh, Babak[UCL] Raskin, Jean-Pierre[UCL] (2018) Semiconductor Science and Technology — Vol. 33, no.1, p. 015001 (2018)
    • Journal article
    Raman analysis of strain in p-type doped silicon nanostructures
    Ureña Begara, Fernando[UCL] Vayrette, Renaud Bhaskar, Umesh Kumar Raskin, Jean-Pierre[UCL] (2018) Journal of Applied Physics — Vol. 124, no.9, p. 095102 (2018)
    • Speech
    Controlling the size, number of layers and planarity of CVD graphene single-crystals
    Huet, Benjamin[UCL] Raskin, Jean-Pierre[UCL] (2018) The 12th international New Diamond and Nano Carbons Conference - NDNC 2018 — Flagstaff, Arizona, USA
    • Speech
    FD SOI technologies from digital to RF and beyond
    Raskin, Jean-Pierre[UCL] (2018) IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference – S3S’18 — San Francisco, USA
    • Speech
    Current status and trends in RF Silicon-on-Insulator material and device
    Raskin, Jean-Pierre[UCL] (2018) The 233rd Electrochemical Society (ECS) Meeting — Seattle, WA, USA
    • Journal article
    Ellipsometry-based electrical characterization of phosphorus doped LPCVD polysilicon
    Kemiha A. Birouk B Raskin, Jean-Pierre[UCL] (2018) Journal of Materials : Materials in Electronics — Vol. 29, no.14, p. 11627-11636 (2018)
    • Speech
    Layout device dimension impact on effective substrate resistivity
    Rack, Martin[UCL] Lederer, Dimitri Nyssens, Lucas[UCL] Paganini, A. Beganovic, A. Raskin, Jean-Pierre[UCL] (2018) IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference – S3S’18 — San Francisco, USA
    • Speech
    Current status and trends in RF SOI material and device
    Raskin, Jean-Pierre[UCL] (2018) SEMICON Korea 2018 — Seoul, Korea
    • Journal article
    Damage evaluation in graphene underlying atomic deposition dielectrics
    Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Poncelet, Olivier[UCL] Louette, Pierre Urea-Begara F. Idrissi, Hosni[UCL] Turner S. Cabossart D. Colomer J.F. Raskin, Jean-Pierre[UCL] (2018) Belvac News - Société Belge de Vacuologie asbl — Vol. 63, no. 3, p. 1-18 (2018)
    • Journal article
    Linear and non-linear electrical behavior in graphene ribbon based devices
    Fates, Rachid[UCL] Raskin, Jean-Pierre[UCL] (2018) Journal of Science: Advanced Materials and Devices — Vol. 3, no.3, p. 366-370 (2018)
    • Journal article
    Extrinsic gate capacitance model for UTBB MOSFETs
    Martinez-Lopez A.G. Tinoco J.C. Lezama G. Conde J.E. Kazemi Esfeh, Babak[UCL] Raskin, Jean-Pierre[UCL] (2018) Semiconductor Science and Technology — Vol. 33, no.1, p. 9 pages (2018)
    • Speech
    28 FDSOI Analog and RF Figures of merit at Cryogenic Temperatures
    Kazemi Esfeh, Babak[UCL] Masselus, Matthieu[UCL] Planes, N. Haond, M. Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2018) 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon EUROSOI-ULIS 2018 — Granada (Spain)

Pages