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1. • Speech

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   Thermal control for in-situ TEM nanomechanical testing devices

   Idrissi, Hosni[UCL] Pip, Alex[UCL] Raskin, Jean-Pierre[UCL] (2021) Micro & Nano Engineering / MNE — Torino
2. • Dissertation

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   Modeling, characterization and optimization of MOSFET's and passive elements for the synthesis of SOI MMIC's

   Raskin, Jean-Pierre[UCL] (1997)
3. • BookChapter

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   Some mitigations for unequal data variance in linear regression

   Dupuis, Pascal[UCL] Van Overstraeten, Nancy[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] (2012) Advanced Mathematical and Computational Tools in Metrology and Testing IX — [ISBN : 978-981-4397-94-0]
4. • Speech

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   Raman Shift Prediction from First Principles in Highly-Strained Silicon

   Roisin, Nicolas[UCL] Colla, Marie-Stéphane[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2022) ICOOPMA 2022 — Gent
5. • Journal article

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   Small- and Large-Signal Performance Up To 175 °C of Low-Cost Porous Silicon Substrate for RF Applications

   Rack, Martin[UCL] Belaroussi, Yasmina Ben Ali, Khaled Scheen, Gilles[UCL] Kazemi Esfeh, Babak[UCL] Raskin, Jean-Pierre[UCL] (2018) IEEE Transactions on Electron Devices — Vol. 65, no.5, p. 1887-1895 (2018)
6. • Speech

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   Advanced TEM Study of Homogeneous Flow and Size Dependent Mechanical Behaviour in Highly Ductile Zr65Ni35 Metallic Glass Films

   Idrissi, Hosni[UCL] Ghidelli, Matteo[UCL] Gravier, Sébastien Blandin, Jean-Jacques Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Schryvers, Dominique (2016) MRS Fall Meeting 2016 — Boston, MA, USA
7. • Journal article

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   RF Small- and Large-Signal Characteristics of CPW and TFMS Lines on Trap-Rich HR-SOI Substrates

   Kazemi Esfeh, Babak[UCL] Rack, Martin[UCL] Ben Ali, Khaled Allibert, Frederic Raskin, Jean-Pierre[UCL] (2018) IEEE Transactions on Electron Devices — Vol. 65, no.8, p. 3120-3126 (2018)
8. • Journal article

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   High quality silicon-based substrates for microwave and millimeter wave passive circuits

   Belaroussi, Y. Rack, Martin[UCL] Saadi, A.A. Scheen, Gilles[UCL] Belaroussi, M.T. Trabelsi, M. Raskin, Jean-Pierre[UCL] (2017) Solid-State Electronics — Vol. 135, no., p. 78-84 (2017)
9. • BookChapter

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   Modeling and Characterization of TSV-Induced Noise Coupling

   Sun, Xiao Rack, Martin[UCL] Van der Plas, Geert Raskin, Jean-Pierre[UCL] Beyne, Eric (2017) Noise Coupling in System-on-Chip — [ISBN : 9781498796774]
10. • Speech

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    A Thin Ultra-wideband Microwave Absorbing Structure Printed On Flexible substrate With Resistive-Ink Made Of Multiwall Carbon-Nanotube

    Jaiswar, Rajkumar Rampati[UCL] Mederos Henry, Francisco[UCL] Dupont, Vedi Hermans, Sophie[UCL] Delcorte, Arnaud[UCL] Bailly, Christian[UCL] Delmotte, Cathy Lardot, Véronique Raskin, Jean-Pierre[UCL] Huynen, Isabelle[UCL] (2017) METAMATERIALS 2017 — Marseillen France
11. • Journal article

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    Mechanical characterization and modelling of Lorentz force based MEMS magnetic field sensors

    Gkotsis, Petros[UCL] Castro, Lara Lopez-Huerta, F. Herrera-May, A.L. Raskin, Jean-Pierre[UCL] (2015) Solid-State Electronics — Vol. 112, no.Special Issue EuroSOI’14, p. 68-77 (October 2015)
12. • Journal article

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    A MEMS-based magnetic field sensor with simple resonant structure and linear electrical response

    Herrera-May, A.L. Lara-Castro, M. Lopez-Huerta, F. Gkotsis, Petros[UCL] Raskin, Jean-Pierre[UCL] Figueras, E. (2015) Microelectronic Engineering — Vol. 142, p. 12-21 (July 2015)
13. • Journal article

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    RF modeling of 40-nm triple-gate SOI FinFET

    Martinez-Lopez, A.G. Cerdeira, Antonio Tinoco, Julio C. Alvarado, J. Padron, W.Y. Mendoza, C. Raskin, Jean-Pierre[UCL] (2015) International Journal of Numerical Modelling: Electronic Networks, Devices and Fields — Vol. 28, p. 465-478 (January 2015)
14. • Journal article

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    A Quasi-Static Model of Silicon Substrate Effects in Graphene Field Effect Transistors

    Haddad, Pierre-Antoine[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2017) IEEE Electron Device Letters — Vol. 38, no.7, p. 987-990 (July 2017)
15. • Speech

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    Automated Layout-integrated Sizing of a 2.45 GHz Differential-Drive Rectifier in 28 nm FDSOI CMOS

    Haddad, Pierre-Antoine[UCL] Stas, François[UCL] Raskin, Jean-Pierre[UCL] Bol, David[UCL] Flandre, Denis[UCL] (2017) 2017 IEEE Wireless Power Transfer Conference (WPTC 2017) — Taipei (Taiwan)
16. • Speech

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    Analog/RF, sensors and MEMS in SOI: demos and performance assessment

    Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Bol, David[UCL] Francis, Laurent[UCL] André, Nicolas[UCL] Raskin, Jean-Pierre[UCL] (2015) SOI Workshop — Dresden (Germany)
17. • Speech

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    Wafer-scale transfer of graphene grown on thin Cu film

    Huet, Benjamin[UCL] Raskin, Jean-Pierre[UCL] (2014) Material research society (MRS) Fall — Boston
18. • Speech

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    Ultra-low-power 130nm SOI CMOS smart sensor for in-situ mechanical stress in SiP and SoC applications

    Al Kadi Jazairli, Mohamad[UCL] André, Nicolas[UCL] Tooten, Ester[UCL] Olbrechts, Benoit[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2016) 14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics - Experiment and Simulation (IRSP 2016) — Bad Schandau (Germany)
19. • Journal article

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    Automated Design of a 13.56 MHz 19µW Passive Rectifier With 72% Efficiency Under 10µA load

    Haddad, Pierre-Antoine[UCL] Gosset, Geoffroy Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2016) IEEE Journal of Solid State Circuits — Vol. 51, no.5, p. 12 (05/2015)
20. • Speech

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    RF SOI CMOS Technology on 1st and 2nd Generation Trap-Rich High Resistivity SOI Wafers

    Kazemi Esfeh, Babak[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2016) 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2016) — Vienne (Austria)
21. • Journal article

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    Assessment of 28nm UTBB FD-SOI technology platform for RF applications: Figures of merit and effect of parasitic elements

    Kazemi Esfeh, Babak[UCL] Kilchytska, Valeriya[UCL] Barral, V. Planes, N. Haond, M. Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2015) Solid-State Electronics — Vol. 117, p. 130-137 (11/12/2015)
22. • Journal article

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    A novel on chip test method to characterize the creep behavior of metallic layers under heavy ion irradiation

    Lapouge, Pierre Onimus, Fabien Vayrette, Renaud[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Bréchet, Yves (2016) Journal of Nuclear Materials — Vol. 476, p. 20-29 (2016)
23. • Journal article

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    Surveying colloid sedimentation by coplanar waveguides

    Dutu, Constantin Augustin[UCL] Vlad, Alexandru[UCL] Roda Neve, Cesar Avram, Ionel[UCL] Sandu, Georgiana[UCL] Raskin, Jean-Pierre[UCL] Melinte, Sorin[UCL] (2016) Nanotechnology — Vol. 27, p. 225502 (2016)
24. • Journal article

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    Absorption modulation of FSS-polymer nanocomposites through incorporation of conductive nanofillers

    Jaiswar, Rajkumar Rampati[UCL] Danlée, Yann[UCL] Mesfin, Henok Mebratie[UCL] Delcorte, Arnaud[UCL] Hermans, Sophie[UCL] Bailly, Christian[UCL] Raskin, Jean-Pierre[UCL] Huynen, Isabelle[UCL] (2017) Applied Physics A — , p. 123-164 (2017)
25. • Speech

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    Through silicon via to FinFET noise coupling in 3-D integrated circuits

    Abadi, A. R. N. Rack, Martin[UCL] Raskin, Jean-Pierre[UCL] (2015) 2015 International conference on IC Design & Technology — Leuven, Belgium

Pages