User menu

Accès à distance ? S'identifier sur le proxy UCLouvain

Search

Displaying 9 results.
    • Speech
    A Low-Power and In Situ Annealing Technique for the Recovery of Active Devices After Proton Irradiation
    Francis, Laurent[UCL] Sedki, Amor[UCL] André, Nicolas[UCL] Kilchytska, Valeriya[UCL] Gérard, Pierre[UCL] Ali, Zeeshan Udrea, Florin Flandre, Denis[UCL] (2017) Conference ANIMMA 2017 — Liège (Belgium)
    • Speech
    Influence of Free Radical Surface Activation on Si/SiC Heterogeneous Integration by Direct Wafer Bonding
    Torchia, P. Pampili, P. O'Connell, J. O'Brien, J. White, M. Schmidt, M. Sheehan, B. Waldron, F. Holmes, J.D. Monaghan, S. Duffy, R. Trajkovic, T. Kilchytska, Valeriya[UCL] Gammon, P. Cherkaoui, K. Hurley, P.K. Gity, F. (2017) 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2017) — Athens (Greece)
    • Speech
    Design and fabrication of a novel power Si/SiC LDMOSFET for high temperature applications
    Gammon, P.M. Li, F. Chan, C.W. Gity, F. Trajkovic, T. Kilchytska, Valeriya[UCL] Pathirana, V. Udugampola, N. Ben Ali, Khaled[UCL] Flandre, Denis[UCL] (2017) 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2017) — Athens (Greece)
    • Speech
    Single Event Effects and Total Ionising Dose in 600V Si-on-SiC LDMOS Transistors for Rad-Hard Space Applications
    Ben Ali, Khaled[UCL] Gammon, P.M. Chan, C.W. Li, F. Pathirana, V. Trajkovic, T. Gity, F. Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2017) 2017 47th European Solid-State Device Research Conference (ESSDERC) — Leuven (Belgium)
    • Speech
    Optimal measurement parameters for accurate time-domain and spectral analyses of RTN
    Van Brandt, Léopold[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] Parvais, Bertrand[UCL] Flandre, Denis[UCL] (2017) 47th IEEE European Solid-State Device Research Conference (ESSDERC) — Leuven, Belgium
    • Speech
    Back-gate bias effect on FDSOI MOSFET RF Figures of Merits and Parasitic Elements
    Kazemi Esfeh, Babak[UCL] Kilchytska, Valeriya[UCL] Parvais, Bertrand Planes, N. Haond, M. Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2017) 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2017) — Athens (Greece)
    • Speech
    Back-gate bias effect on 3-port UTBB-FDSOI non-linearity performance
    Kazemi Esfeh, Babak[UCL] Kilchytska, Valeriya[UCL] Parvais, Bertrand Planes, Nicolas Haond, M. Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2017) 2017 47th European Solid-State Device Research Conference (ESSDERC 2017) — Leuven (Belgium)
    • Speech
    Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs
    Kilchytska, Valeriya[UCL] Kazemi Esfeh, Babak[UCL] Gimeno Gasca, Cecilia[UCL] Parvais, B. Planes, N. Hahond, M. Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2017) 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon – ULIS — Athens, Greece
    • Speech
    Measurement and modelling of specific behaviors in 28nm FD SOI UTBB MOSFETs of importance for analog / RF amplifiers
    Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Gimeno Gasca, Cecilia[UCL] Bol, David[UCL] Kazemi Esfeh, Babak[UCL] Raskin, Jean-Pierre[UCL] (2017) MOS-AK Workshop — Leuven (Belgium)