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Displaying 13 results.
    • Journal article
    Review on analog RF performance of advanced MOSFET
    Passi Vikram Raskin, Jean-Pierre[UCL] (2017) Semiconductor Science and Technology — Vol. 32, no.12, p. 123004 (2017)
    • Journal article
    Compact On-Wafer Test Structures for Device RF Characterization
    Kazemi Esfeh, Babak[UCL] Ben Ali, Khaled[UCL] Raskin, Jean-Pierre[UCL] (2017) IEEE Transactions on Electron Devices — Vol. 64, no.8, p. 3101-3107 (August 2017)
    • Journal article
    Pressure-controlled chemical vapor deposition of single-layer graphene with millimeter-size domains on thin Cu film
    Huet, Benjamin[UCL] Raskin, Jean-Pierre[UCL] (2017) Chemistry of Materials — Vol. 29, no.8, p. 3431-3440 (March 2017)
    • Journal article
    RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers
    Kazemi Esfeh, Babak[UCL] Makovejev, Sergej Basso, Didier Desbonnets, Eric Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2017) Solid-State Electronics, Special Issue EuroSOI-ULIS 2016 — Vol. 128, no.February 2017, p. 121-128 (February 2017)
    • Journal article
    Raman and XPS characterization of vanadium oxide thin films with temperature
    Ureña Begara, Fernando[UCL] Crunteanu, Aurelian Raskin, Jean-Pierre[UCL] (2017) Applied Surface Science — Vol. 403, no.1 May 2017, p. 717-727 (May 2017)