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Displaying 1 - 25 of 33 results.

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    • Speech
    RF SOI, from material to devices
    Raskin, Jean-Pierre[UCL] (2017) Short Course SMC, IEEE International Microwave Symposium – IMS’17 — Honolulu, Hawaii (USA)
    • Journal article
    Review on analog RF performance of advanced MOSFET
    Passi Vikram Raskin, Jean-Pierre[UCL] (2017) Semiconductor Science and Technology — Vol. 32, no.12, p. 123004 (2017)
    • Speech
    Current status and trends in RF SOI material and device
    Raskin, Jean-Pierre[UCL] (2017) SEMICON Europa 2017 — Munich, Germany
    • Speech
    A SPDT RF switch small- and large-signal characteristics on TR-HR SOI substrates
    Kazemi Esfeh, Babak[UCL] Makovejev S. Allibert F. Raskin, Jean-Pierre[UCL] (2017) IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference — San Francisco, USA
    • Speech
    Optimal measurement parameters for accurate time-domain and spectral analyses of RTN
    Van Brandt, Léopold[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] Parvais, Bertrand[UCL] Flandre, Denis[UCL] (2017) 47th IEEE European Solid-State Device Research Conference (ESSDERC) — Leuven, Belgium
    • Speech
    RF harmonic distortion modeling in CPW lines on silicon-based substrates including non-equilibrium carrier dynamics
    Rack, Martin[UCL] Raskin, Jean-Pierre[UCL] (2017) 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017 — Honololu, HI, USA
    • Speech
    Back-gate bias effect on FDSOI MOSFET RF Figures of Merits and Parasitic Elements
    Kazemi Esfeh, Babak[UCL] Kilchytska, Valeriya[UCL] Parvais, Bertrand Planes, N. Haond, M. Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2017) 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2017) — Athens (Greece)
    • Speech
    Small- and large-signal RF modeling of silicon-based substrates
    Rack, Martin[UCL] Raskin, Jean-Pierre[UCL] (2017) ESSDERC/ESSCIRC 2017 — Leuven, Belgium
    • Speech
    Back-gate bias effect on 3-port UTBB-FDSOI non-linearity performance
    Kazemi Esfeh, Babak[UCL] Kilchytska, Valeriya[UCL] Parvais, Bertrand Planes, Nicolas Haond, M. Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2017) 2017 47th European Solid-State Device Research Conference (ESSDERC 2017) — Leuven (Belgium)
    • Speech
    A hybrid gas sensor based on compound of graphene with polypyrrole
    Tang, Xiaohui[UCL] Lahem, Driss Raskin, Jean-Pierre[UCL] Debliquy, Marc (2017) 31st International Conference on Surface Modification Technologies — Mons (Belgium)
    • Speech
    Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs
    Kilchytska, Valeriya[UCL] Kazemi Esfeh, Babak[UCL] Gimeno Gasca, Cecilia[UCL] Parvais, B. Planes, N. Hahond, M. Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2017) 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon – ULIS — Athens, Greece
    • Speech
    Intrinsic rectification in gated CVD graphene ribbons
    Haddad, Pierre-Antoine[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2017) Graphene Barcelona 2017 — Barcelona, Spain
    • Speech
    Electromechanical testing of ZnO thin films under high uniaxial strain
    Tuyaerts, Romain[UCL] Raskin, Jean-Pierre[UCL] Proost, Joris[UCL] (2017) The 30th International Conference on Microelectronic Test Structures – ICMTS 2017 — Grenoble, France
    • Speech
    Ultra-low-power SOI CMOS pressure sensor based on orthogonal PMOS gauges
    André, Nicolas[UCL] Delhaye, Thibault[UCL] Al Kadi Jazairli, Mohamad[UCL] Olbrechts, Benoit[UCL] Gérard, Pierre[UCL] Francis, Laurent[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2017) 22nd IMEKO TC4 International Symposum & 20th International Workshop on ADC Modelling and Testing — Iasi (Romania)
    • Journal article
    Compact On-Wafer Test Structures for Device RF Characterization
    Kazemi Esfeh, Babak[UCL] Ben Ali, Khaled[UCL] Raskin, Jean-Pierre[UCL] (2017) IEEE Transactions on Electron Devices — Vol. 64, no.8, p. 3101-3107 (August 2017)
    • Journal article
    Pressure-controlled chemical vapor deposition of single-layer graphene with millimeter-size domains on thin Cu film
    Huet, Benjamin[UCL] Raskin, Jean-Pierre[UCL] (2017) Chemistry of Materials — Vol. 29, no.8, p. 3431-3440 (March 2017)
    • Journal article
    RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers
    Kazemi Esfeh, Babak[UCL] Makovejev, Sergej Basso, Didier Desbonnets, Eric Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2017) Solid-State Electronics, Special Issue EuroSOI-ULIS 2016 — Vol. 128, no.February 2017, p. 121-128 (February 2017)

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