Accès à distance ? S'identifier sur le proxy UCLouvain
Displaying 19 results.
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(2008) Nanotechnology — Vol. 19, no. 16, p. 165703 (2008) -
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(2008) Materials Science in Semiconductor Processing — Vol. 11, no. 5-6, p. 148-159 (2008) -
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(2008) Solid-State Electronics — Vol. 52, no. 12, p. 1915-1923 (2008) -
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(2008) Microelectronics — Vol. 39, no. 12, p. 1663-1670 (2008) -
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(2008) IEEE Transactions on Electron Devices — Vol. 55, no. 7, p. 1664-1671 (2008) -
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(2008) IEEE Transactions on Microwave Theory and Techniques — Vol. 56, no. 3, p. 587-598 (2008) -
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(2008) IEEE Transactions on Electron Devices — Vol. 55, no. 10, p. 2718-2727 (2008) -
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(2008) IEEE Transactions on Electron Devices — Vol. 55, no. 5, p. 1192-1202 (2008) -
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(2008) Applied Surface Science — Vol. 254, no. 19, p. 6168-6173 (2008) -
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(2008) ECS Transactions — Vol. 16, no. 8, p. 165-174 (2008) -
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(2008) Journal of Applied Physics — Vol. 104, no. 10, p. 103523 (2008) -
- Journal article
(2008) Polytec InFocus - Optical Measurement Solutions — no. 2, p. 22-23 (February 2008) -
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(2008) ECS Transactions — Vol. 13, no. 2, p. 83-90 (February 2008) -
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(2008) Proceedings of the European Microwave Association — Vol. 4, p. 199-205 (June 2008) -
- Journal article
(2008) IEEE Electronic Device Letters — Vol. 29, no. 4, p. 396-398 (April 2008) -
- Journal article
(2008) Solid-State Electronics — Vol. 52, no.12, p. 1924-1932 (2008) -
- Journal article
(2008) ECS Transactions — Vol. 14, p. 273-282 (2008) -
- Journal article
(2008) Journal of Applied Physics — Vol. 104, no.10, p. 103523 (2008)