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Displaying 24 results.
    • Journal article
    Wideband characterization of SOI materials and devices
    Raskin, Jean-Pierre[UCL] (2007) Solid-State Electronics — Vol. 51, p. 1161-1171 (2007)
    • Journal article
    A 2.4-GHz Fully Integrated ESD-Protected Low-Noise Amplifier in 130-nm PD SOI CMOS Technology
    El Kaamouchi, Majid[UCL] Si Moussa, Mehdi[UCL] Delatte, Pierre Wybo, G. Bens, A. Raskin, Jean-Pierre[UCL] Vanhoenacker-Janvier, Danielle[UCL] (2007) IEEE Transactions on Microwave Theory and Techniques — Vol. 55, no.12, pp. 2822-2831 (December 2007)
    • Journal article
    Characterization of the body node in PD SOI MOSFETs using multiport VNA measurements
    Lederer, Dimitri Raskin, Jean-Pierre[UCL] (2007) IEEE Transactions on Electron Devices — Vol. 54, no. 11, p. 3030-3039 (2007)
    • Journal article
    Electrical detection of DNA hybridization : three extraction techniques based on interdigitated Al/Al2O3 capacitors
    Moreno Hagelsieb, Luis[UCL] Laurent, Géry[UCL] Pampin, Rémi[UCL] Foultier, Boris[UCL] Remacle, Jean-François[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2007) Biosensors and Bioelectronics, Elsevier Science, Pergamon — Vol. 22, no. 9-10, p. 2199-2207 (2007)
    • Journal article
    Application of Double Gate Graded-Channel SOI in MOSFET-C Balanced Structures
    Doria, R.T. Pavanello, M.A. Cerdeira, A. Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2007) Electrochimical Society Transactions — Vol. 6, no. 4, p. 217-222 (April 2007)
    • Journal article
    Molecular bonding aided by dissipative inter-layers
    Bertholet, Y. Olbrechts, Benoit[UCL] Lejeune, B. Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2007) Acta Materialia — Vol. 55, no. 2, p. 473-479 (2007)
    • Journal article
    On-wafer wideband electrical characterization : a powerful tool for improving the IC technologies
    Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2007) Journal of Telecommunications and Information Technology — , no. 2, p. 69-77 (February 2007)
    • Journal article
    Characterization of FD SOI devices and VCO's on ONO membranes under pressure
    Olbrechts, Benoit[UCL] Rue, Bertrand[UCL] Suski, J. Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2007) Solid-State Electronics — Vol. 51, no. 9, p. 1229-1237 (2007)
    • Journal article
    On the origin of the excess low-frequency noise in graded-channel silicon-on-insulator nMOSFETs
    Simoen, Eddy Flandre, Denis[UCL] Claeys, C. Chung, T. M. Raskin, Jean-Pierre[UCL] (2007) IEEE Electron Device Letters — Vol. 28, no. 10, p. 919-921 (2007)
    • Journal article
    The Length-Dependence of the 1/f Noise of Graded-Channel SOI nMOSFETs
    Simoen, E. Claeys, C. Chung, Tsung Ming[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2007) ECS Transactions — Vol. 9, no. 1, p. 373-381 (September)
    • Journal article
    Low-frequency noise behavior of graded-channel SOI n-MOSFETs
    Simoen, E. Claeys, C. Chung, Tsung Ming[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Pavanello, M.A. Martino, J.A. (2007) Solid-State Electronics, Special issue — Vol. 51, no. 2, p. 260-267 (2007)
    • Journal article
    From Nanoelectronics towards Nanoelectromechanical Systems
    Raskin, Jean-Pierre[UCL] IKER, F. André, Nicolas[UCL] Fabrègue, Damien[UCL] Coulombier, Michaël[UCL] Pardoen, Thomas[UCL] (2007) Revue E Tijdschrift — Vol. 1, no. mars/avril 2007, p. 26-33 (2007)
    • Journal article
    Bulk and surface micromachined MEMS in thin film SOI technology
    Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Iker, François[UCL] André, Nicolas[UCL] Olbrechts, Benoit[UCL] Pardoen, Thomas[UCL] (2007) Electrochimica Acta — Vol. 52, no. 8, p. 2850-2861 (2007)