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1. • Speech

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   Characterising the effect of uniaxial strain on the surface roughness of Si nanowire MEMS-based microstructures

   Escobedo-Cousin, E. Raskin, Jean-Pierre[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Olsen, S. (2010) 2010 Materials Research Society Fall Meeting - MRS Fall'10 — Boston, MA, USA
2. • Journal article

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   On-chip tensile testing of the mechanical and electro-mechanical properties of nano-scale silicon free-standing beams

   Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Zulfiqar, Azeem[UCL] Sodervall, U. Nilsson, B. Peterson, G. Hagberg, M. Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) Advanced Materials Research — Vol. 276, no. -, pp. 117-126 (2011)
3. • Journal article

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   Nanomechanical testing of free-standing monocrystalline silicon beams

   Bhaskar, Umesh Kumar[UCL] Houri, Samer[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) ECS Transactions — Vol. 35, no. 5, p. 221-226 (May 2011)
4. • Speech

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   Nanomechanical testing of thin metallic films application to aluminium, palladium and chromium films

   Ryelandt, Sophie[UCL] Carbonnelle, Pierre[UCL] Boe, Alexandre[UCL] Coulombier, Michaël[UCL] Bhaskar, Umesh Kumar[UCL] Zulfiqar, Azeem[UCL] Colla, Marie-Stéphane[UCL] Dille, J. Poirier, C. Proost, Joris[UCL] Godet, Stéphane[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2010) European Conference on Nano Film - ECNF'10 — Liège, Belgium
5. • Speech

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   Application of process induced stress to study the mechanical properties of monocrystalline and amorphous silicon thin films

   Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2010) Nanomechanical Testing Workshop and Hysitron User Meeting — INM, Saarbrücken, Germany
6. • Speech

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   Lab-on-chips based testing methods to investigate the mechanical behavior of nanofilms

   Carbonnelle, Pierre[UCL] Ryelandt, Sophie[UCL] Boe, Alexandre[UCL] Coulombier, Michaël[UCL] Zulfiqar, Azeem[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2010) European Conference on Nano Film - ECNF'10 — Liège, Belgium
7. • Speech

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   Internal stress relaxation based method to extract the Young's modulus of brittle and ductile thin layers

   Boé, A. Coulombier, Michaël[UCL] Colla, Marie-Stéphane[UCL] Bhaskar, Umesh Kumar[UCL] Zulfiqar, Azeem[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2009) Innovations in Thin Film Processing and Characterization - ITFPC'09 — Nancy - France
8. • Journal article

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   A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects

   Pardoen, Thomas[UCL] Colla, Marie-Stéphane[UCL] Idrissi, Hosni[UCL] Amin-Ahmadi, Behnam Wang, Binjie Schryvers, Dominique Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] (2016) Comptes rendus. Physique — Vol. 17, no.3-4, p. 485-495 (2016)
9. • Journal article

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   Piezoresistance of nano-scale silicon up to 2GPa in tension

   Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Passi, Vikram Raskin, Jean-Pierre[UCL] (2013) Applied Physics Letters — Vol. 102, no.3, p. 031911 (2013)
10. • Journal article

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    Strain in silicon nanowire beams

    Urena, F. Olsen, S.H. Šiller, L. Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2012) Journal of Applied Physics — Vol. 112, no. 11, p. 114506 (2012)
11. • Journal article

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    Characterizing the effect of uniaxial strain on the surface roughness of Si nanowire MEMS-based microstructures

    Escobedo-Cousin, E. Olsen, S.H. Pardoen, Thomas[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] (2011) MRS Proceedings, Micromechanical Systems - Materials and Devices — Vol. 1299, p. article 25 (2011)
12. • Speech

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    On-Chip tensile testing of the mechanical and electro-mechanical properties of nano-scale silicon free-standing beams up to fracture

    Raskin, Jean-Pierre[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] (2013) PiezoNEMS 2013 - PHELMA-Polygone — Grenoble, France
13. • Speech

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    Surface effects on the electrical, mechanical and electro-mechanical properties of silicon nano wires

    Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Passi, Vikram Houri, S. Raskin, Jean-Pierre[UCL] (2013) 2013 MRS Spring Meeting & Exhibit — San Francisco, California, USA
14. • Speech

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    New testing method for ductility of thin Al films (oral pres. by M. Coulombier)

    Coulombier, Michaël[UCL] Boé, A. Bhaskar, Umesh Kumar[UCL] Ryelandt, Sophie[UCL] Brugger, Charles[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2009) ECI 2009, Nanomechanical Testing in Materials Research and Development — Barga (Tuscany), Italy
15. • Speech

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    Lab-on-chips based testing methods to investigate the mechanical behaviour of thin films

    Carbonnelle, Pierre[UCL] Ryelandt, Sophie[UCL] Boe, Alexandre[UCL] Coulombier, Michaël[UCL] Zulfiqar, Azeem[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2010) 2nd International Conference on Functional Nanocoatings — Dresden, Germany
16. • Speech

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    Application of process induced stress to study the mechanical properties of monocrystalline and amorphous silicon thin films (poster pres. by U. Bhaskar)

    Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2010) Nanobrucken Nanomechanical testing Workshop, INM — Saarbrucken - Germany
17. • Speech

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    On-chip testing of (freestanding) thin films

    Pardoen, Thomas[UCL] Coulombier, Michaël[UCL] Colla, Marie-Stéphane[UCL] Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Houri, Samer[UCL] Raskin, Jean-Pierre[UCL] Idrissi, Hosni[UCL] (2012) Indentation 2012 — Ecully, France
18. • Journal article

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    Surface states and conductivity of silicon nano-wires

    Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Passi, Vikram Raskin, Jean-Pierre[UCL] (2013) Journal of Applied Physics — Vol. 113, no.13, p. 134502 (2013)
19. • Journal article

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    Dynamic analysis of multi-beam MEMS structures for the extraction of the stress-strain response of thin films

    Houri, Samer[UCL] Bhaskar, Umesh Kumar[UCL] Gallacher, B. Francis, Laurent[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2013) Experimental Mechanics : an international journal of the Society for Experimental Mechanics — Vol. 53, no. 3, p. 441-453 (March 2013)
20. • Speech

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    Nanomechanical testing of free-standing monocrystalline silicon beams

    Bhaskar, Umesh Kumar[UCL] Houri, Samer[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) 219th ECS Meeting - Symposium E8 - Advanced Semiconductor-on-Insulator Technology and Related Physics — Montreal, Canada
21. • Speech

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    High throughput lab-on-chip for testing the mechanical properties of thin films

    Ryelandt, Sophie[UCL] Carbonnelle, Pierre[UCL] Coulombier, Michaël[UCL] Colla, Marie-Stéphane[UCL] Houri, Samer[UCL] Zeb, G.[UCL] Zulfiqar, A.[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2011) European Congress on Advanced Materials and Processes – EuroMAT 2011 — Montpellier, France
22. • Speech

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    On-chip tensile testing for the investigation of thin films, nanoribbons and nanowires mechanical properties

    Vayrette, Renaud[UCL] Coulombier, Michaël[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2012) Journées de la Matière Condensée - JMC13 — Montpellier, France
23. • Speech

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    Nano-mechanical testing of free-standing mono-crystalline silicon beams

    Bhaskar, Umesh Kumar[UCL] Houri, Samer[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) The 219th Electrochemical Society Meeting – ECS 2011 — Montreal, QC, Canada
24. • Speech

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    Surface and stress effects on the electrical conductivity of nano-scale silicon

    Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2012) 2012 MRS Fall Meeting & Exhibit — Boston, Massachusetts, UDA
25. • Journal article

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    Note: Fast and reliable fracture strain extraction technique applied to silicon at nanometer scale

    Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Sodervall, Ulf Nilsson, Bengt Petersson, Goran Hagberg, Mats Raskin, Jean-Pierre[UCL] (2011) Review of Scientific Instruments — Vol. 82, p. 116106 (2011)

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