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Charge injection characterization of thin-film SOI MOS transistors at high temperature
Primary tabs
| Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
|---|---|
| Publication date | 2001 |
| Language | Anglais |
| Conference | "Tenth International Symposium on Silicon-on-Insulator Technology and Devices", Washington, DC (USA) (du 25/03/2001 au 30/03/2001) |
| Peer reviewed | yes |
| Host document | "Electrochemical Society. Proceedings"- 115-120 |
| Affiliations |
CISSOID SA UCL - FSA/ELEC - Département d'électricité |
| Keywords | SOI CMOS |
| Links |
| Bibliographic reference | Picun, Gonzalo ; Demeûs, Laurent ; Flandre, Denis. Charge injection characterization of thin-film SOI MOS transistors at high temperature.Tenth International Symposium on Silicon-on-Insulator Technology and Devices (Washington, DC (USA), du 25/03/2001 au 30/03/2001). In: Electrochemical Society. Proceedings, 2001, p.115-120 |
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| Permanent URL | http://hdl.handle.net/2078.1/96918 |