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Critical assessment by analytical electron microscopy of the significance of XPS measurements of the dispersion of supported catalysts
Primary tabs
Delannay, Francis
[UCL]
Houalla, M.
[UCL]
Pirotte, D.
[UCL]
Delmon, Bernard
[UCL]
Houalla, M.
[UCL]
Pirotte, D.
[UCL]
Delmon, Bernard
[UCL]
| Document type | Article de périodique (Journal article) – Article de recherche |
|---|---|
| Publication date | 1979 |
| Language | Anglais |
| Journal information | "Surface and Interface Analysis" - Vol. 1, no. -, p. 172 - 174 (1979) |
| Peer reviewed | yes |
| Publisher | JohnWiley & Sons Ltd. ((United Kingdom) Bognor Regis) |
| issn | 0142-2421 |
| Publication status | Publié |
| Affiliations |
UCL
- FSA/MAPR - Département des sciences des matériaux et des procédés UCL - AGRO/CABI - Département de chimie appliquée et des bio-industries |
| Links |
| Bibliographic reference | Delannay, Francis ; Houalla, M. ; Pirotte, D. ; Delmon, Bernard. Critical assessment by analytical electron microscopy of the significance of XPS measurements of the dispersion of supported catalysts. In: Surface and Interface Analysis, Vol. 1, no. -, p. 172 - 174 (1979) |
|---|---|
| Permanent URL | http://hdl.handle.net/2078.1/74754 |