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In-situ monitoring of the growth stress evolution during galvanostatic anodising of aluminium thin films
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| Document type | Communication à un colloque (Conference Paper) – Abstract, Présentation orale avec comité de sélection |
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| Publication date | 2008 |
| Language | Anglais |
| Conference | "213th Meeting of the Electrochemical Society", Phoenix (2008) |
| Peer reviewed | yes |
| Host document | "Proceedings"- p. #594 |
| Affiliation | UCL - FSA/MAPR - Département des sciences des matériaux et des procédés |
| Links |
| Bibliographic reference | Van Overmeere, Quentin ; Vanhumbeeck, Jean-François ; Proost, Joris. In-situ monitoring of the growth stress evolution during galvanostatic anodising of aluminium thin films.213th Meeting of the Electrochemical Society (Phoenix, 2008). In: Proceedings, 2008, p. #594 |
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| Permanent URL | http://hdl.handle.net/2078.1/70885 |