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The dispersion of nickel oxide supported on boron-modified silicas, as determined by TEM and XPS measurements

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Houalla, M. Delannay, Francis [UCL] Delmon, Bernard [UCL]

The dispersion of NiO supported on boron-modified silicas has been studied by transmission electron microscopy (TEM) and XPS. The TEM experiments showed that all NiO is present in the form of crystallites; values for the dispersion were calculated on the basis of measurements of the size distributions of these crystallites. The XPS measurements were interpreted using a model which assumes large particle sizes and no re-partitioning of the supported species between internal pores and the surface when boron-modification is performed. The variations of dispersion with boron content obtained from this model agree well with the variations measured by TEM.

Document type Article de périodique (Journal article) – Article de recherche
Access type Accès restreint
Publication date 1982
Journal information "Journal of Electron Spectroscopy and Related Phenomena" - Vol. 25, no. 1, p. 59-65 (1982)
Peer reviewed yes
issn 0368-2048
Publication status Publié
Affiliation UCL
Links
Bibliographic reference Houalla, M. ; Delannay, Francis ; Delmon, Bernard. The dispersion of nickel oxide supported on boron-modified silicas, as determined by TEM and XPS measurements. In: Journal of Electron Spectroscopy and Related Phenomena, Vol. 25, no. 1, p. 59-65 (1982)
Permanent URL http://hdl.handle.net/2078.1/66485