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Current Lines and Accurate Contact Current Evaluation in 2-d Numerical-simulation of Semiconductor-devices
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| Document type | Article de périodique (Journal article) – Article de recherche |
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| Publication date | 1985 |
| Language | Anglais |
| Journal information | "IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems" - Vol. 4, no. 4, p. 496-503 (1985) |
| Peer reviewed | yes |
| Publisher | Ieee-inst Electrical Electronics Engineers Inc (New York) |
| issn | 0278-0070 |
| e-issn | 1937-4151 |
| Publication status | Publié |
| Affiliation | UCL |
| Links |
| Bibliographic reference | Palm, E. ; Vandewiele, F.. Current Lines and Accurate Contact Current Evaluation in 2-d Numerical-simulation of Semiconductor-devices. In: IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems, Vol. 4, no. 4, p. 496-503 (1985) |
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| Permanent URL | http://hdl.handle.net/2078.1/54976 |