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A Comparison of Aes, Sims, Iss and Rbs Analysis of Sixny Layers

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Vandenberghe, Rik [UCL] Vlaeminck, R. Vancraen, M. Herbots, N. Gloesener, D. Gybels, R.
Document type Article de périodique (Journal article) – Article de recherche
Access type Accès restreint
Publication date 1987
Language Anglais
Journal information "Fresenius' Zeitschrift fuer Analytische Chemie" - Vol. 329, no. 2-3, p. 380-384 (1987)
Peer reviewed yes
Publisher Springer Verlag (New York)
issn 0016-1152
Publication status Publié
Affiliation UCL
Links
  1. Morosanu C (1980) Thin Solid Films 65:171
  2. Lea C (1983) Metal Sci 17:357
  3. Werner H (1975) Surface Sci 47:301
  4. Baun WL (1981) Surface Interface Anal 3:243
  5. Borders JA, Picraux ST (1974) Proc IEEE 62:1224
  6. Lifshits VG, Saranin AA (1984) Solid State 50:925
  7. Vanden Berghe R, Hinoul H, Vlaeminck R, Fransen F, Vennik J (1983) Le Vide 215:189
Bibliographic reference Vandenberghe, Rik ; Vlaeminck, R. ; Vancraen, M. ; Herbots, N. ; Gloesener, D. ; et. al. A Comparison of Aes, Sims, Iss and Rbs Analysis of Sixny Layers. In: Fresenius' Zeitschrift fuer Analytische Chemie, Vol. 329, no. 2-3, p. 380-384 (1987)
Permanent URL http://hdl.handle.net/2078.1/53521