Weng, LT.
Legras, Roger
[UCL]
Poleunis, Claude
[UCL]
Bertrand, Patrick
[UCL]
Carlier, Véronique
[UCL]
Sclavons, Michel
[UCL]
Franquinet, P.
Time-of-flight secondary ion mass spectrometry (TOF SIMS) and X-ray photoelectron spectroscopy (XPS) have been jointly used to study a two-step surface processing of AS4 carbon fiber: extraction of sizing in CH2Cl2 and functionalization with trimellitic anhydride. The combined information on molecular specificity obtained with TOF SIMS and quantification obtained with XPS allows us to follow qualitatively and quantitatively the changes in functional groups on the carbon surface. The results show that the sizing on AS4 contains at least four different compounds. These compounds can be extracted in CH2Cl2 and the elimination is almost complete for silicone. The functionalization of AS4 with trimellitic anhydride has been realized. The reaction takes place between the amine groups on the carbon fiber and the two types of functional groups in trimellitic anhydride.
- Wakelyn N. T., Resolution of wide-angle x-ray scattering from a thermoplastic composite, 10.1002/pola.1986.080240906
- Xie, Y., Wang, T. and Sherwood, P. M. A. 1992.Appl. SpectroscVol. 46, 645 and refs cited therein
- Drzal L.T., The role of the fiber-matrix interphase on composite properties, 10.1016/0042-207x(90)94034-n
- Santiago F., Mansour A. N., Lee R. N., XPS study of sizing removal from carbon fibers, 10.1002/sia.740100105
- Desimoni E., Casella G. I., Cataldi T. R. I., Salvi A. M., Rotunno T., Di Croce E., Remarks on the surface characterization of carbon fibres, 10.1002/sia.740180809
- Briggs, D. 1992.Practical Surface and Interface Analysis, Edited by: Briggs, D. and Seah, M. P. Vol. 2, 368Chichester: John Wiley.
- Hearn M. J., Briggs D., TOF-SIMS satudies of carbon-fibre surfaces and carbon-fibre composite fracture surfaces, 10.1002/sia.740170704
- Carlier, V., Sclavons, M., Franquinet, P., Legras, R., Poleunis, C., Weng, L. T. and Bertrand, P. August 1994.Proceedings of the First International Conference on Composites Engineering, Edited by: Hui, D. August, 28–31. 831New Orleans: University of New Orleans. New Orleans
- Schueler B., Sander P., Reed D.A., A time-of-flight secondary ion microscope, 10.1016/0042-207x(90)94047-t
- Xie Yaoming, Sherwood Peter M. A., AS4 PAN‐based Carbon Fiber by Core Level and Valence Band XPS, 10.1116/1.1247657
- Weng L. T., Vereecke G., Genet M. J., Rouxhet P. G., Stone-Masui J. H., Bertrand P., Stone W. E. E., Quantitative XPS. Part II: Comparison between different quantitative approaches for two different spectrometers?determination of the contamination-reduced thickness, application of the determined transmission functions and accuracy achieved, 10.1002/sia.740200303
- Hammer G.E., Drzal L.T., Graphite fiber surface analysis by X-ray photoelectron spectroscopy and polar/dispersive free energy analysis, 10.1016/0378-5963(80)90083-5
- Briggs, D., Brown, A. and Vickerman, J. C. 1989.Handbook of Static SIMS, 42Chichester: John Wiley.
- Briggs, D. and Seah, M. P., eds. 1990.Practical Surface and Interface Analysis, 2nd, Vol. 1, 603Chichester: John Wiley.
- Tan K. L., Tan B. T. G., Kang E. T., Neoh K. G., The chemical nature of the nitrogens in polypyrrole and polyaniline: A comparative study by x‐ray photoelectron spectroscopy, 10.1063/1.460524
- Beamson G., High Resolution XPS of Organic Polymers: The Scienta ESCA 300 Database (1992)
Bibliographic reference |
Weng, LT. ; Legras, Roger ; Poleunis, Claude ; Bertrand, Patrick ; Carlier, Véronique ; et. al. Sizing Removal and Functionalization of the Carbon-fiber Surface Studied By Combined Tof Sims and Xps. In: Journal of Adhesion Science and Technology : the international journal of theoretical and basic aspects of adhesion science and its applications in all areas of technology, Vol. 9, no. 7, p. 859-871 (1995) |
Permanent URL |
http://hdl.handle.net/2078.1/47927 |