Raskin, Jean-Pierre
[UCL]
Dambrine, G.
Gillon, R.
A new extraction scheme is proposed which allows to determine all the series equivalent circuit elements values from S-parameters measurements at a single bias point in saturation, Exploiting the specific shape of a set of impedance loci, the new scheme uses linear regression techniques to solve the extraction problem, The resulting algorithm is very simple and efficient when compared to optimizer-driven approaches.
Bibliographic reference |
Raskin, Jean-Pierre ; Dambrine, G. ; Gillon, R.. Direct extraction of the series equivalent circuit parameters for the small-signal model of SOI MOSFET's. In: IEEE Microwave and Guided Wave Letters, Vol. 7, no. 12, p. 408-410 (1997) |
Permanent URL |
http://hdl.handle.net/2078.1/45803 |