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High-Frequency Noise Performance of 60-nm Gate-Length FinFETs

Bibliographic reference Raskin, Jean-Pierre ; Pailloncy, Guillaume ; Lederer, Dimitri ; Danneville, Francois ; Dambrine, Gilles ; et. al. High-Frequency Noise Performance of 60-nm Gate-Length FinFETs. In: IEEE Transactions on Electron Devices, Vol. 55, no. 10, p. 2718-2727 (2008)
Permanent URL http://hdl.handle.net/2078.1/36291