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Scanning gate microscopy of quantum rings: effects of an external magnetic field and of charged defects

Bibliographic reference Pala, M. G. ; Baltazar, S. ; Rodrigues Martins, Frederico ; Hackens, Benoît ; Sellier, H. ; et. al. Scanning gate microscopy of quantum rings: effects of an external magnetic field and of charged defects. In: Nanotechnology, Vol. 20, no. 26 (2009)
Permanent URL http://hdl.handle.net/2078.1/35534