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Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach
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Document type | Article de périodique (Journal article) – Article de recherche |
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Access type | Accès libre |
Publication date | 2017 |
Language | Anglais |
Journal information | "Micron" - Vol. 94, p. 66-73 (2017) |
Peer reviewed | yes |
Publisher | Pergamon (Kidlington) |
issn | 0968-4328 |
e-issn | 1878-4291 |
Publication status | Publié |
Affiliations |
UCL
- SST/IMMC/IMAP - Materials and process engineering University of Antwerp - EMAT Karlsruhe Institute of Technology (KIT) - Institute for Applied Materials |
Keywords | Twin-jet-electro-polishing ; Focused ion beam ; In-situ TEM tensile test ; FIB-induced damages ; Size effect |
Links |
Bibliographic reference | Samaeeaghmiyoni, Vahid ; Idrissi, Hosni ; Groten, Jonas ; Schwaiger, Ruth ; Schryvers, Dominique. Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach. In: Micron, Vol. 94, p. 66-73 (2017) |
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Permanent URL | http://hdl.handle.net/2078.1/184078 |