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Study of creep/relaxation in nanocrystalline FCC thin films through internal-stress-actuated microtensile testing method

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Bibliographic reference Lemoine, Guerric ; Colla, Marie-Stéphane ; Amin-Ahmadi, B. ; Idrissi, Hosni ; Schryvers, D. ; et. al. Study of creep/relaxation in nanocrystalline FCC thin films through internal-stress-actuated microtensile testing method.13th International Conference on Creep and Fracture of Engineering Materials and Structures - CREEP2015 (Toulouse, du 31/05/2015 au 04/06/2015).
Permanent URL http://hdl.handle.net/2078.1/160868