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Bias-temperature phenomena in SOI structures and devices
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| Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
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| Publication date | 1998 |
| Language | Anglais |
| Conference | "NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices"", Kiev (Ukraine) (du 12/10/1998 au 15/10/1998) |
| Peer reviewed | yes |
| Host document | "Proceedings of the NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices"" |
| Publication status | Publié |
| Affiliation | UCL - FSA/ELEC - Département d'électricité |
| Keywords | SOI |
| Links |
| Bibliographic reference | Nazarov, A.N. ; Barchuk, I.P. ; Kilchytska, Valeriya. Bias-temperature phenomena in SOI structures and devices.NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" (Kiev (Ukraine), du 12/10/1998 au 15/10/1998). In: Proceedings of the NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices", 1998 |
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| Permanent URL | http://hdl.handle.net/2078.1/132842 |