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Nanomechanical tensile testing of metallic thin films
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Wang, Bingyu
[UCL]
Idrissi, Hosni
[UCL]
Colla, Marie-Stéphane
[UCL]
Coulombier, Michaël
[UCL]
Boé, Alexandre
[UCL]
Proost, J.
[UCL]
Raskin, Jean-Pierre
[UCL]
Pardoen, Thomas
[UCL]
Schryvers, D.
[University of Antwerp, Antwerp, Belgium]
Boé, Alexandre
[UCL]
Proost, J.
[UCL]
Raskin, Jean-Pierre
[UCL]
Pardoen, Thomas
[UCL]
Schryvers, D.
[University of Antwerp, Antwerp, Belgium]
| Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
|---|---|
| Publication date | 2010 |
| Language | Anglais |
| Conference | "MICROSCIENCE 2010", London, UK (du 28/06/2010 au 01/07/2010) |
| Peer reviewed | yes |
| Host document | "Proceedings of MICROSCIENCE 2010"- p. Paper M3.2-0142 |
| Publication status | Publié |
| Affiliation | UCL - SST/ICTM - Institute of Information and Communication Technologies, Electronics and Applied Mathematics |
| Keywords | NANO |
| Links |
| Bibliographic reference | Wang, Bingyu ; Idrissi, Hosni ; Colla, Marie-Stéphane ; Coulombier, Michaël ; Boé, Alexandre ; et. al. Nanomechanical tensile testing of metallic thin films.MICROSCIENCE 2010 (London, UK, du 28/06/2010 au 01/07/2010). In: Proceedings of MICROSCIENCE 2010, 2010, p. Paper M3.2-0142 |
|---|---|
| Permanent URL | http://hdl.handle.net/2078/123511 |