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A compact model for single event effects in PD SOI sub-micron MOSFETs

Bibliographic reference Alvarado Pulido, José Joaquin ; Kilchytska, Valeriya ; Boufouss, El Hafed ; Soto-Cruz, B.S. ; Flandre, Denis. A compact model for single event effects in PD SOI sub-micron MOSFETs. In: IEEE Transactions on Nuclear Science, Vol. 59, no. 4, p. 943-949 (14/08/2012)
Permanent URL http://hdl.handle.net/2078.1/114337