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Assessment of advanced SOI CMOS technologies for high-temperature applications
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Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
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Publication date | 2007 |
Language | Anglais |
Conference | "The International Conference on High Temperature Electronics (HITEN 2007)", Oxford (Royaume-Uni) (du 17/09/2007 au 19/09/2007) |
Peer reviewed | yes |
Host document | "Proceedings of the International Conference on High Temperature Electronics (HITEN 2007)" |
Affiliation | UCL - FSA/ELEC - Département d'électricité |
Keywords | SOI ; CMOS |
Links |
Bibliographic reference | Kilchytska, Valeriya ; Flandre, Denis. Assessment of advanced SOI CMOS technologies for high-temperature applications.The International Conference on High Temperature Electronics (HITEN 2007) (Oxford (Royaume-Uni), du 17/09/2007 au 19/09/2007). In: Proceedings of the International Conference on High Temperature Electronics (HITEN 2007), 2007 |
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Permanent URL | http://hdl.handle.net/2078.1/106162 |