User menu

Accès à distance ? S'identifier sur le proxy UCLouvain

Assessment of advanced SOI CMOS technologies for high-temperature applications

Bibliographic reference Kilchytska, Valeriya ; Flandre, Denis. Assessment of advanced SOI CMOS technologies for high-temperature applications.The International Conference on High Temperature Electronics (HITEN 2007) (Oxford (Royaume-Uni), du 17/09/2007 au 19/09/2007). In: Proceedings of the International Conference on High Temperature Electronics (HITEN 2007), 2007
Permanent URL http://hdl.handle.net/2078.1/106162