Search

Pages

1. New lab-on-chip fracture nanomechanical testing device for extracting properties of thin film materials : silicon nitride

   By : Jaddi, Sahar[UCL] Directed by : Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2017) Ecole polytechnique de Louvain

2. High quality substrate for high frequency FD SOI technology

   By : Cardinael, Pieter[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2019) Ecole polytechnique de Louvain

3. Mechanical testing of nano-materials

   By : Gillet, Julien[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2016) Ecole polytechnique de Louvain

4. Etude des propriétés mécaniques de films minces via des essais "Push-to-pull" in-situ sous TEM : développement d’un support pour films minces de cuivre par les techniques de micro-fabrication

   By : Segers, Jeremy[UCL] Directed by : Raskin, Jean-Pierre[UCL] Idrissi, Hosni[UCL] (2017) Ecole polytechnique de Louvain

5. Study of mobility including ballistic effects in advanced MOSFETs

   By : Vandermolen, Eric[UCL] Directed by : Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] Parvais, Bertrand (2017) Ecole polytechnique de Louvain

6. Mise au point et analyse d’un système de potabilisation d'eau low-tech

   By : Goyens, Virgile[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2021) Ecole polytechnique de Louvain

7. Analysis and optimization of a 28nm FD-SOI CMOS Low Noise Amplifier with phase control at 76-81 GHz

   By : Versonnen, Anton[UCL] Directed by : Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) Ecole polytechnique de Louvain

8. Good practice and critical reflection for the realisation of a prototype of a Differential Multiventilation

   By : Vanhoeter, Rodolphe[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2023) Ecole polytechnique de Louvain

9. Joint evaluation of performance and environmental impacts of a microfabricated device : VO2-based device

   By : Raux, Pauline[UCL] Directed by : Raskin, Jean-Pierre[UCL] Bidoul, Noémie[UCL] Pip, Alex[UCL] (2023) Ecole polytechnique de Louvain

10. Dimensions and doping level impacts on the cutoff frequency of a Schottky diode in 22FDX technology

    By : Vandroogenbroek, Arthur[UCL] Directed by : Raskin, Jean-Pierre[UCL] Lederer, Dimitri[UCL] (2023) Ecole polytechnique de Louvain

Pages