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Displaying 9 results.

  1. AC compact modelling of low-frequency noise for 28nm CMOS technology and beyond
    By : Van Brandt, Léopold[UCL] Directed by : Flandre, Denis[UCL] Raskin, Jean-Pierre (2017) Ecole polytechnique de Louvain

  2. Étude de la durabilité de la voiture autonome
    By : Zanellato, Raphaël[UCL] Gombault, Benoît[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2019) Ecole polytechnique de Louvain

  3. Caractérisation d'un transistor FDSOI à basse température
    By : Masselus, Matthieu[UCL] Directed by : Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2019) Ecole polytechnique de Louvain

  4. Engineered Si-based substrate for RF applications
    By : Smirnov, Serguei[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2016) Ecole polytechnique de Louvain

  5. The investigation of aluminum oxide (Al2O3) as gate dielectric in ultra thin body and buried oxide (UTBB) fully depleted (FD) silicon-on-insulator (SOI) transistor
    By : Yan, Yiyi[UCL] Directed by : Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2019) Ecole polytechnique de Louvain

  6. Assessment of the split CV mobility extraction method in 28nm FDSOI transistors
    By : Morelle, Alban[UCL] Directed by : Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2020) Ecole polytechnique de Louvain

  7. RF characterization of the back-gate contact on Fully Depleted SOI MOSFETs
    By : Vanbrabant, Martin[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2020) Ecole polytechnique de Louvain

  8. The thinnest capacitor in the world
    By : Mounzer, Abbas[UCL] Directed by : Hackens, Benoît[UCL] Raskin, Jean-Pierre[UCL] (2020) Ecole polytechnique de Louvain

  9. Performance and sustainability analysis of 28GHz switch technologies
    By : Scailquin, Hugo[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2020) Ecole polytechnique de Louvain