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1. AC compact modelling of low-frequency noise for 28nm CMOS technology and beyond

   By : Van Brandt, Léopold[UCL] Directed by : Flandre, Denis[UCL] Raskin, Jean-Pierre (2017) Ecole polytechnique de Louvain

2. Characterisation of electric properties in thin bismuth films

   By : Thomas, Brice[UCL] Directed by : Hackens, Benoît[UCL] Raskin, Jean-Pierre[UCL] (2018) Ecole polytechnique de Louvain

3. hBN-assisted dry transfer of CVD graphene

   By : De Muyter, Laurence[UCL] Lejeune, Antoine[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2017) Ecole polytechnique de Louvain

4. Strain engineering for opto-electronic properties change of Si & Ge at nanometer scale and an improved data reduction scheme for lab-on-chip devices

   By : Pip, Alex[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2020) Ecole polytechnique de Louvain

5. Towards the design of a paper-based microfluidic sensor for water quality monitoring and comparative life cycle assessment

   By : Crahay, Odile[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2020) Ecole polytechnique de Louvain

6. Assessment of the split CV mobility extraction method in 28nm FDSOI transistors

   By : Morelle, Alban[UCL] Directed by : Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2020) Ecole polytechnique de Louvain

7. Faisabilité et durabilité d'une aviation commerciale décarbonisée

   By : Poncin, Amaury[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2020) Ecole polytechnique de Louvain

8. RF characterization of the back-gate contact on Fully Depleted SOI MOSFETs

   By : Vanbrabant, Martin[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2020) Ecole polytechnique de Louvain

9. The thinnest capacitor in the world

   By : Mounzer, Abbas[UCL] Directed by : Hackens, Benoît[UCL] Raskin, Jean-Pierre[UCL] (2020) Ecole polytechnique de Louvain

10. Performance and sustainability analysis of 28GHz switch technologies

    By : Scailquin, Hugo[UCL] Directed by : Raskin, Jean-Pierre[UCL] (2020) Ecole polytechnique de Louvain

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