RF characterization of the back-gate contact on Fully Depleted SOI MOSFETs

Bibliographic reference Vanbrabant, Martin. RF characterization of the back-gate contact on Fully Depleted SOI MOSFETs. Ecole polytechnique de Louvain, Université catholique de Louvain, 2020. Prom. : Raskin, Jean-Pierre.
Permanent URL http://hdl.handle.net/2078.1/thesis:26763