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Displaying 6 results.
    • BookChapter
    Characterization of alternate polyelectrolyte thin films by ToF-SIMS and XPS
    Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Wischerhoff, Erik[UCL] Laschewsky, André[UCL] (1998) ICPSI - 2, Polymer-Solid Interfaces : From Model to Real Systems —
    • BookChapter
    Secondary molecular emission in static SIMS of organic materials
    Bertrand, Patrick[UCL] Delcorte, Arnaud[UCL] (1998) Secondary Ion Mass Spectrometry: SIMS XI — [ISBN : 0-471-97826-4]
    • Journal article
    Influence of chemical structure and beam degradation on the kinetic energy of molecular secondary ions in keV ion sputtering of polymers
    Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] (1998) Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms — Vol. 135, no. 1-4, p. 430-435 (1998)
    • Journal article
    Sputtering of parent-like ions from large organic adsorbates on metals under keV ion bombardment
    Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] (1998) Surface Science — Vol. 413, p. 97-124 (1998)
    • BookChapter
    Unimolecular dissociation of metastable secondary ions in SIMS of polymers
    Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] (1998) Secondary Ion Mass Spectrometry: SIMS XI — [ISBN : 0-471-97826-4]
    • BookChapter
    ToF-SIMS and XPS study of thin multilayered coatings realized by successive adsorption and functionalization of charged polymer layers
    Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Wischerhoff, Erik[UCL] Laschewsky, André[UCL] (1998) Secondary Ion Mass Spectrometry: SIMS XI — [ISBN : 0-471-97826-4]